Sebastien Derhy

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Tel Aviv, IL

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Patents Grantslast 30 patents

Information Patent Grant
Simultaneous localization and mapping (SLAM) using dual event cameras
- Patent number 11,668,571
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Sebastien Derhy
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Simultaneous location and mapping (SLAM) using dual event cameras
- Patent number 10,948,297
- Issue date Mar 16, 2021
- Samsung Electronics Co., Ltd.
- Sebastien Derhy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor auto-configuration
- Patent number 10,939,049
- Issue date Mar 2, 2021
- Samsung Electronics Co., Ltd.
- Nathan Henri Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor auto-configuration
- Patent number 10,812,730
- Issue date Oct 20, 2020
- Samsung Electronics Co., Ltd.
- Nathan Henri Levy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIMULTANEOUS LOCATION AND MAPPING (SLAM) USING DUAL EVENT CAMERAS
- Publication number 20230258455
- Publication date Aug 17, 2023
- Samsung Electronics Co., Ltd.
- SEBASTIEN DERHY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULTANEOUS LOCATION AND MAPPING (SLAM) USING DUAL EVENT CAMERAS
- Publication number 20210190497
- Publication date Jun 24, 2021
- Samsung Electronics Co., Ltd.
- Sebastien Derhy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR AUTO-CONFIGURATION
- Publication number 20200389583
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Nathan Henri Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR AUTO-CONFIGURATION
- Publication number 20200029006
- Publication date Jan 23, 2020
- Samsung Electronics Co., Ltd.
- Nathan Henri Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULTANEOUS LOCATION AND MAPPING (SLAM) USING DUAL EVENT CAMERAS
- Publication number 20200011668
- Publication date Jan 9, 2020
- Samsung Electronics Co., Ltd.
- Sebastien Derhy
- G01 - MEASURING TESTING