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Sebastien Egret
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Lumbin, FR
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Patents Grants
last 30 patents
Information
Patent Grant
Transforming metrology data from a semiconductor treatment system u...
Patent number
8,346,506
Issue date
Jan 1, 2013
Tokyo Electron Limited
Vi Vuong
G01 - MEASURING TESTING
Information
Patent Grant
Transforming metrology data from a semiconductor treatment system u...
Patent number
8,170,833
Issue date
May 1, 2012
Tokyo Electron Limited
Vi Vuong
G01 - MEASURING TESTING
Information
Patent Grant
Transforming metrology data from a semiconductor treatment system u...
Patent number
7,467,064
Issue date
Dec 16, 2008
Timbre Technologies, Inc.
Vi Vuong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...
Publication number
20120199287
Publication date
Aug 9, 2012
TOKYO ELECTRON LIMITED
Vi Vuong
G01 - MEASURING TESTING
Information
Patent Application
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...
Publication number
20090094001
Publication date
Apr 9, 2009
Timbre Technologies, Inc.
Vi Vuong
G01 - MEASURING TESTING
Information
Patent Application
Transforming metrology data from a semiconductor treatment system u...
Publication number
20070185684
Publication date
Aug 9, 2007
Timbre Technologies, Inc.
Vi Vuong
G01 - MEASURING TESTING