Sebastien Jacqueline

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Bernieres Sur Mer, FR

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Patents Grantslast 30 patents

Information Patent Grant
Embedded structure for passivation integrity testing
- Patent number 8,519,388
- Issue date Aug 27, 2013
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EMBEDDED STRUCTURE FOR PASSIVATION INTEGRITY TESTING
- Publication number 20110140104
- Publication date Jun 16, 2011
- NXP B.V.
- Lucie A. Rousseville
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INCREASING THE QUALITY FACTOR OF AN INDUCTOR IN A SEIMICO...
- Publication number 20090267182
- Publication date Oct 29, 2009
- NXP B.V.
- Sebastien Jacqueline
- H01 - BASIC ELECTRIC ELEMENTS