Membership
Tour
Register
Log in
Seck June Foo
Follow
Person
Johor Bahru, MY
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of and apparatus for testing an integrated circuit package
Patent number
6,531,865
Issue date
Mar 11, 2003
Advanced Micro Devices, Inc.
Zhihong Mai
G01 - MEASURING TESTING