See Jean CHAN

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Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Cold plate with porous thermal conductive structure
- Patent number 11,706,902
- Issue date Jul 18, 2023
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Thermal test head for an integrated circuit device
- Patent number 11,454,666
- Issue date Sep 27, 2022
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal test head for an integrated circuit device
- Patent number 11,378,615
- Issue date Jul 5, 2022
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact tester
- Patent number 11,181,575
- Issue date Nov 23, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Grant
Cold plate with porus thermal conductive structure
- Patent number 11,129,297
- Issue date Sep 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Configurable electronic device tester system
- Patent number 9,927,478
- Issue date Mar 27, 2018
- AEM SINGAPORE PTE. LTD.
- Boon Hua How
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
COLD PLATE AND A METHOD OF MANUFACTURE THEREOF
- Publication number 20210385968
- Publication date Dec 9, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20210325453
- Publication date Oct 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20210325452
- Publication date Oct 21, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean CHAN
- G01 - MEASURING TESTING
Information Patent Application
COMPACT TESTER
- Publication number 20210011078
- Publication date Jan 14, 2021
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
COLD PLATE AND A METHOD OF MANUFACTURE THEREOF
- Publication number 20200383238
- Publication date Dec 3, 2020
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
AUTOMATED PICKING APPARATUS WITH MAGNETIC REPULSION FOR PICKING AN...
- Publication number 20180354142
- Publication date Dec 13, 2018
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CONFIGURABLE ELECTRONIC DEVICE TESTER SYSTEM
- Publication number 20170010313
- Publication date Jan 12, 2017
- AEM SINGAPORE PTE. LTD.
- Boon Hua HOW
- G01 - MEASURING TESTING

See Jean CHAN

Person

Patents Grantslast 30 patents

Cold plate with porous thermal conductive structure

Thermal test head for an integrated circuit device

Thermal test head for an integrated circuit device

Compact tester

Cold plate with porus thermal conductive structure

Configurable electronic device tester system

Patents Applicationslast 30 patents

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

COLD PLATE AND A METHOD OF MANUFACTURE THEREOF

THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE

THERMAL TEST HEAD FOR AN INTEGRATED CIRCUIT DEVICE

COMPACT TESTER

COLD PLATE AND A METHOD OF MANUFACTURE THEREOF

AUTOMATED PICKING APPARATUS WITH MAGNETIC REPULSION FOR PICKING AN...

CONFIGURABLE ELECTRONIC DEVICE TESTER SYSTEM