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Patents Grantslast 30 patents

Information Patent Grant
Probe and manufacturing method of probe for scanning probe microscope
- Patent number 11,125,775
- Issue date Sep 21, 2021
- Kioxia Corporation
- See Kei Lee
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,069,513
- Issue date Jul 20, 2021
- Kioxia Corporation
- Mitsuo Koike
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE AND MANUFACTURING METHOD OF PROBE FOR SCANNING PROBE MICROSCOPE
- Publication number 20210278437
- Publication date Sep 9, 2021
- KIOXIA Corporation
- See Kei LEE
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210066045
- Publication date Mar 4, 2021
- KIOXIA Corporation
- Mitsuo KOIKE
- H01 - BASIC ELECTRIC ELEMENTS