Seema Somani

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
Differential pulsed laser beam probing of integrated circuits
- Patent number 6,252,222
- Issue date Jun 26, 2001
- Schlumberger Technologies, Inc.
- Steven A. Kasapi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...
- Publication number 20240410937
- Publication date Dec 12, 2024
- FEI Company
- James S. Vickers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20210098228
- Publication date Apr 1, 2021
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORM SEPARATION FOR RESOLUTION LIMITED OPTICAL PROBING TOOLS
- Publication number 20200333394
- Publication date Oct 22, 2020
- FEI Company
- Tenzile Berkin Cilingiroglu
- G01 - MEASURING TESTING
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190287762
- Publication date Sep 19, 2019
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190227119
- Publication date Jul 25, 2019
- FEI Company
- James VICKERS
- G01 - MEASURING TESTING