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Veldhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Inspection substrate and an inspection method
Patent number
10,725,390
Issue date
Jul 28, 2020
ASML Netherlands B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Inspection substrate and an inspection method
Patent number
10,216,100
Issue date
Feb 26, 2019
ASML Netherlands B.V.
Seerwan Saeed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Inspection Substrate and an Inspection Method
Publication number
20190146352
Publication date
May 16, 2019
ASML NETHERLANDS B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Substrate and an Inspection Method
Publication number
20180181004
Publication date
Jun 28, 2018
ASML NETHERLANDS B.V.
Seerwan SAEED
H01 - BASIC ELECTRIC ELEMENTS