Segey Sofer

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Reshon Letzion, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing a variable digital delay line and a device havin...
- Patent number 8,368,383
- Issue date Feb 5, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yefim-Haim Fefer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING A VARIABLE DIGITAL DELAY LINE AND A DEVICE HAVIN...
- Publication number 20100072979
- Publication date Mar 25, 2010
- Freescale Semiconductor,Inc
- Yefim-Haim Fefer
- G01 - MEASURING TESTING