SEHOON PARK

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Gwangju, KR

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Patents Grantslast 30 patents

Information Patent Grant
Probe for testing a semiconductor device and a probe card including...
- Patent number 12,038,458
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Sung Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having power converter and test system including the same
- Patent number 11,585,833
- Issue date Feb 21, 2023
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...
- Publication number 20250149107
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G11 - INFORMATION STORAGE
Information Patent Application
PROBE CARD HAVING POWER CONVERTER AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20220341967
- Publication date Oct 27, 2022
- Samsung Electronics Co., Ltd.
- SEHOON PARK
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...
- Publication number 20220308088
- Publication date Sep 29, 2022
- Korea Instrument Co.,Ltd.
- SUNG HOON LEE
- G01 - MEASURING TESTING