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Gwangju, KR
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last 30 patents
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Patent Grant
Probe card having power converter and test system including the same
Patent number
11,585,833
Issue date
Feb 21, 2023
Samsung Electronics Co., Ltd.
Sehoon Park
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE CARD HAVING POWER CONVERTER AND TEST SYSTEM INCLUDING THE SAME
Publication number
20220341967
Publication date
Oct 27, 2022
Samsung Electronics Co., Ltd.
SEHOON PARK
G01 - MEASURING TESTING
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Patent Application
PROBE FOR TESTING A SEMICONDUCTOR DEVICE AND A PROBE CARD INCLUDING...
Publication number
20220308088
Publication date
Sep 29, 2022
Korea Instrument Co.,Ltd.
SUNG HOON LEE
G01 - MEASURING TESTING