Sei Umisedo

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ion source
- Patent number 7,750,313
- Issue date Jul 6, 2010
- Nissin Ion Equipment Co., Ltd.
- Hideki Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam measuring method and ion implanting apparatus
- Patent number 7,655,929
- Issue date Feb 2, 2010
- Nissin Ion Equipment Co., Ltd.
- Sei Umisedo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam measuring method and ion implanting apparatus
- Patent number 7,368,734
- Issue date May 6, 2008
- Nissin Ion Equipment Co., Ltd.
- Sei Umisedo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source
- Patent number 7,365,339
- Issue date Apr 29, 2008
- Nissin Ion Equipment Co., Ltd.
- Hideki Fujita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion source
- Publication number 20080277593
- Publication date Nov 13, 2008
- NISSIN ION EQUIPMENT CO., LTD.
- Hideki Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam measuring method and ion implanting apparatus
- Publication number 20080073579
- Publication date Mar 27, 2008
- NISSIN ION EQUIPMENT CO., LTD.
- Sei Umisedo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam measuring method and ion implanting apparatus
- Publication number 20070023674
- Publication date Feb 1, 2007
- Sei Umisedo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source
- Publication number 20060284104
- Publication date Dec 21, 2006
- NISSIN ION EQUIPMENT CO., LTD.
- Hideki Fujita
- H01 - BASIC ELECTRIC ELEMENTS