Sei Yoshihara

Follow

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
- Patent number 11,733,185
- Issue date Aug 22, 2023
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,079,345
- Issue date Aug 3, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
- Patent number 10,876,978
- Issue date Dec 29, 2020
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT X-RAY ANALYSIS APPARATUS
- Publication number 20210116399
- Publication date Apr 22, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20210063326
- Publication date Mar 4, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...
- Publication number 20190227005
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING