Seido Biwa

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring unit and rotary valve for use therein
- Patent number 7,985,376
- Issue date Jul 26, 2011
- Sysmex Corporation
- Seido Biwa
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Sample analyzer
- Patent number 7,964,142
- Issue date Jun 21, 2011
- Sysmex Corporation
- Kazunori Mototsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring immature platelets
- Patent number 7,892,850
- Issue date Feb 22, 2011
- Sysmex Corporation
- Shinichiro Oguni
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number 7,487,061
- Issue date Feb 3, 2009
- Sysmex Corporation
- Seido Biwa
- G01 - MEASURING TESTING
Information Patent Grant
Automatic sample analyzer and its components
- Patent number 6,772,650
- Issue date Aug 10, 2004
- Sysmex Corporation
- Yasuhiro Ohyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring unit and rotary valve for use therein
- Publication number 20060216213
- Publication date Sep 28, 2006
- Seido Biwa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Apparatus and method for measuring immature platelets
- Publication number 20050002826
- Publication date Jan 6, 2005
- Sysmex Corporation
- Shinichiro Oguni
- G01 - MEASURING TESTING
Information Patent Application
Sample analyzer
- Publication number 20030220761
- Publication date Nov 27, 2003
- Sysmex Corporation
- Seido Biwa
- G01 - MEASURING TESTING
Information Patent Application
Automatic sample analyzer and its components
- Publication number 20030070498
- Publication date Apr 17, 2003
- Yasuhiro Ohyama
- G01 - MEASURING TESTING
Information Patent Application
Measuring unit and rotary valve for use therein
- Publication number 20020172617
- Publication date Nov 21, 2002
- Seido Biwa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL