Seigo Ando

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Avalanche photodiode
- Patent number 9,006,854
- Issue date Apr 14, 2015
- NTT Electronics Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,754,445
- Issue date Jun 17, 2014
- NTT Electronics Corporation
- Tadao Ishibashi
- G02 - OPTICS
Information Patent Grant
Avalanche photodiode
- Patent number 8,729,602
- Issue date May 20, 2014
- NTT Electronics Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche photodiode
- Patent number 8,575,650
- Issue date Nov 5, 2013
- NTT Electronics Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche photodiode having doping region with monotonically increa...
- Patent number 7,880,197
- Issue date Feb 1, 2011
- NTT Electronics Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor optoelectronic waveguide
- Patent number 7,787,736
- Issue date Aug 31, 2010
- NTT Electronics Corporation
- Tadao Ishibashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor optoelectronic waveguide
- Patent number 7,599,595
- Issue date Oct 6, 2009
- NTT Electronics Corporation
- Tadao Ishibashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Avalanche photodiode
- Patent number 7,557,387
- Issue date Jul 7, 2009
- Nippon Telegraph and Telephone Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film deposition method of nitride semiconductor and nitride se...
- Patent number 6,920,166
- Issue date Jul 19, 2005
- Nippon Telegraph and Telephone Corporation
- Tetsuya Akasaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic flux measuring method and apparatus for detecting high fre...
- Patent number 5,537,038
- Issue date Jul 16, 1996
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for magnetically detecting defects in an objec...
- Patent number 5,512,821
- Issue date Apr 30, 1996
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for magnetic inspection using magnetic shield, with speci...
- Patent number 5,502,382
- Issue date Mar 26, 1996
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for magnetic inspection using magnetic shield
- Patent number 5,357,198
- Issue date Oct 18, 1994
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Saturable core magnetometer with a parallel resonant circuit in whi...
- Patent number 5,287,059
- Issue date Feb 15, 1994
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic inspection apparatus for thin steel strip having magnetize...
- Patent number 5,235,275
- Issue date Aug 10, 1993
- NKK Corporation
- Seigo Ando
- G01 - MEASURING TESTING
Information Patent Grant
Recording medium playing apparatus
- Patent number 5,151,793
- Issue date Sep 29, 1992
- Pioneer Electronic Corporation
- Hiroshi Ito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Current measuring method and apparatus therefor
- Patent number 5,132,608
- Issue date Jul 21, 1992
- Katsuyuki Nishifuji
- Katsuyuki Nishifuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130313608
- Publication date Nov 28, 2013
- Nippon Telegraph and Telephone Corporation
- Tadao Ishibashi
- G02 - OPTICS
Information Patent Application
AVALANCHE PHOTODIODE
- Publication number 20130168793
- Publication date Jul 4, 2013
- NTT ELECTRONICS CORPORATION
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AVALANCHE PHOTODIODE
- Publication number 20130154045
- Publication date Jun 20, 2013
- Nippon Telegraph and Telephone Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AVALANCHE PHOTODIODE
- Publication number 20110241150
- Publication date Oct 6, 2011
- NTT Electronics Corporation
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AVALANCHE PHOTODIODE
- Publication number 20100163925
- Publication date Jul 1, 2010
- NTT ELECTRONICS CORPORATION
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor optoelectronic waveguide
- Publication number 20080304786
- Publication date Dec 11, 2008
- NTT ELECTRONICS CORPORATION
- Tadao Ishibashi
- G02 - OPTICS
Information Patent Application
Avalanche Photodiode
- Publication number 20070200141
- Publication date Aug 30, 2007
- NTT ELECTRONICS CORPORATION
- Tadao Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor optoelectronic waveguide
- Publication number 20070172184
- Publication date Jul 26, 2007
- Tadao Ishicashi
- G02 - OPTICS
Information Patent Application
Thin film deposition method of nitride semiconductor and nitride se...
- Publication number 20030179793
- Publication date Sep 25, 2003
- Nippon Telegraph and Telephone Corporation
- Tetsuya Akasaka
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Avalanche photodiode

Semiconductor device

Avalanche photodiode

Avalanche photodiode

Avalanche photodiode having doping region with monotonically increa...

Semiconductor optoelectronic waveguide

Semiconductor optoelectronic waveguide

Avalanche photodiode

Thin film deposition method of nitride semiconductor and nitride se...

Magnetic flux measuring method and apparatus for detecting high fre...

Method and apparatus for magnetically detecting defects in an objec...

Apparatus for magnetic inspection using magnetic shield, with speci...

Apparatus for magnetic inspection using magnetic shield

Saturable core magnetometer with a parallel resonant circuit in whi...

Magnetic inspection apparatus for thin steel strip having magnetize...

Recording medium playing apparatus

Current measuring method and apparatus therefor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

AVALANCHE PHOTODIODE

AVALANCHE PHOTODIODE

AVALANCHE PHOTODIODE

AVALANCHE PHOTODIODE

Semiconductor optoelectronic waveguide

Avalanche Photodiode

Semiconductor optoelectronic waveguide

Thin film deposition method of nitride semiconductor and nitride se...