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Seigo FUJITA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Information processing device, information processing method, and c...
Patent number
11,774,598
Issue date
Oct 3, 2023
Mitsubishi Electric Corporation
Kazuhiro Nishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Local error generation device, computer readable medium, and positi...
Patent number
11,378,696
Issue date
Jul 5, 2022
Mitsubishi Electric Corporation
Seigo Fujita
G01 - MEASURING TESTING
Information
Patent Grant
Positioning augmentation device, positioning augmentation method, a...
Patent number
11,175,411
Issue date
Nov 16, 2021
Mitsubishi Electric Corporation
Masakazu Miya
G01 - MEASURING TESTING
Information
Patent Grant
Positioning augmentation device, positioning augmentation system, a...
Patent number
11,131,774
Issue date
Sep 28, 2021
Mitsubishi Electric Corporation
Masakazu Miya
G01 - MEASURING TESTING
Information
Patent Grant
Information processing device
Patent number
10,816,669
Issue date
Oct 27, 2020
Mitsubishi Electric Corporation
Masayuki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Positioning device
Patent number
10,802,152
Issue date
Oct 13, 2020
Mitsubishi Electric Corporation
Masayuki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Information processing device and positioning device
Patent number
10,598,792
Issue date
Mar 24, 2020
Mitsubishi Electric Corporation
Masakazu Miya
G01 - MEASURING TESTING
Information
Patent Grant
Conversion device and computer readable medium
Patent number
10,578,746
Issue date
Mar 3, 2020
Mitsubishi Electric Corporation
Masakazu Miya
G01 - MEASURING TESTING
Information
Patent Grant
Global positioning device
Patent number
10,393,879
Issue date
Aug 27, 2019
Mitsubishi Electric Corporation
Masayuki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Positioning device
Patent number
10,371,820
Issue date
Aug 6, 2019
Mitsubishi Electric Corporation
Masayuki Saito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
Publication number
20220120913
Publication date
Apr 21, 2022
Mitsubishi Electric Corporation
Kazuhiro NISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
LOCAL ERROR GENERATION DEVICE, COMPUTER READABLE DEVICE, AND POSITI...
Publication number
20200064486
Publication date
Feb 27, 2020
MITSUBISHI ELECTRIC CORPORATION
Seigo FUJITA
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING AUGMENTATION DEVICE, POSITIONING AUGMENTATION METHOD, A...
Publication number
20190317224
Publication date
Oct 17, 2019
MITSUBISHI ELECTRIC CORPORATION
Masakazu MIYA
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING AUGMENTATION DEVICE, POSITIONING AUGMENTATION SYSTEM, A...
Publication number
20190250277
Publication date
Aug 15, 2019
MITSUBISHI ELECTRIC CORPORATION
Masakazu MIYA
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND POSITIONING DEVICE
Publication number
20170363744
Publication date
Dec 21, 2017
MITSUBISHI ELECTRIC CORPORATION
Masakazu MIYA
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND POSITIONING DEVICE
Publication number
20170269217
Publication date
Sep 21, 2017
MITSUBISHI ELECTRIC CORPORATION
Masayuki SAITO
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE AND POSITIONING DEVICE
Publication number
20170227649
Publication date
Aug 10, 2017
MITSUBISHI ELECTRIC CORPORATION
Masayuki SAITO
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING DEVICE
Publication number
20170131408
Publication date
May 11, 2017
MITSUBISHI ELECTRIC CORPORATION
Masayuki SAITO
G01 - MEASURING TESTING
Information
Patent Application
CONVERSION DEVICE AND COMPUTER READABLE MEDIUM
Publication number
20170123072
Publication date
May 4, 2017
MITSUBISHI ELECTRIC CORPORATION
Masakazu MIYA
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING DEVICE
Publication number
20170090038
Publication date
Mar 30, 2017
MITSUBISHI ELECTRIC CORPORATION
Masayuki SAITO
G01 - MEASURING TESTING