Seiichi Murayama

Person

both Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray exposure method with an X-ray mask comprising phase shifter s...
- Patent number 5,372,916
- Issue date Dec 13, 1994
- Hitachi, Ltd.
- Taro Ogawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Circular fluorescent lamp
- Patent number 5,034,655
- Issue date Jul 23, 1991
- Hitachi, Ltd.
- Seiichi Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma source mass spectrometer
- Patent number 4,963,735
- Issue date Oct 16, 1990
- Hitachi, Ltd.
- Yukio Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Equipment for manufacturing semiconductor devices
- Patent number 4,936,252
- Issue date Jun 26, 1990
- Hitachi, Ltd.
- Yusuke Yajima
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for generating light by utilizing microwave
- Patent number 4,933,602
- Issue date Jun 12, 1990
- Hitachi, Ltd.
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave plasma production apparatus
- Patent number 4,908,492
- Issue date Mar 13, 1990
- Hitachi, Ltd.
- Yukio Okamoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Trace element spectrometry with plasma source
- Patent number 4,902,099
- Issue date Feb 20, 1990
- Hitachi, Ltd.
- Yukio Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Low-pressure discharge lamp
- Patent number 4,879,493
- Issue date Nov 7, 1989
- Hitachi, Ltd.
- Hiromistu Mastuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma X-ray source
- Patent number 4,841,556
- Issue date Jun 20, 1989
- Hitachi, Ltd.
- Yasuo Kato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Compact fluorescent lamp
- Patent number 4,803,401
- Issue date Feb 7, 1989
- Hitachi, Ltd.
- Hiromitsu Matsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-pressure discharge lamp operating circuit
- Patent number 4,803,406
- Issue date Feb 7, 1989
- Hitachi, Ltd.
- Makoto Yasuda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for thin film formation using photo-induced chemical reac...
- Patent number 4,716,852
- Issue date Jan 5, 1988
- Hitachi, Ltd.
- Kanji Tsujii
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Plasma x-ray source
- Patent number 4,715,054
- Issue date Dec 22, 1987
- Hitachi, Ltd.
- Yasuo Kato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Low-pressure mercury vapor discharge lamp
- Patent number 4,697,121
- Issue date Sep 29, 1987
- Hitachi, Ltd.
- Yasuo Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of photochemical surface treatment
- Patent number 4,678,536
- Issue date Jul 7, 1987
- Hitachi, Ltd.
- Seiichi Murayama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Grazing incidence reflection spectrometer
- Patent number 4,653,908
- Issue date Mar 31, 1987
- Hitachi, Ltd.
- Yusuke Yajima
- G01 - MEASURING TESTING
Information Patent Grant
Method of dry etching
- Patent number 4,643,799
- Issue date Feb 17, 1987
- Hitachi, Ltd.
- Kanji Tsujii
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Stain resistant fluorescent lamp
- Patent number 4,642,512
- Issue date Feb 10, 1987
- Hitachi, Ltd.
- Hiromitsu Matsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma X-ray source
- Patent number 4,627,086
- Issue date Dec 2, 1986
- Hitachi, Ltd.
- Yasuo Kato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High intensity ultraviolet light source
- Patent number 4,622,493
- Issue date Nov 11, 1986
- Hitachi, Ltd.
- Makoto Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discharge lamp with neon gas in outer tube
- Patent number 4,622,485
- Issue date Nov 11, 1986
- Hitachi, Ltd.
- Tsune Miyashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dry etching apparatus
- Patent number 4,615,756
- Issue date Oct 7, 1986
- Hitachi, Ltd.
- Kanji Tsujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-pressure mercury vapor discharge lamp
- Patent number 4,611,148
- Issue date Sep 9, 1986
- Hitachi, Ltd.
- Yasuo Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-pressure discharge lamp operating circuit
- Patent number 4,587,460
- Issue date May 6, 1986
- Hitachi, Ltd.
- Seiichi Murayama
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Low-pressure mercury vapor discharge lamp
- Patent number 4,587,453
- Issue date May 6, 1986
- Hitachi, Ltd.
- Tetsuo Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatography apparatus
- Patent number 4,523,096
- Issue date Jun 11, 1985
- Hitachi, Ltd.
- Makoto Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control system for an element analyzer
- Patent number 4,339,201
- Issue date Jul 13, 1982
- Hitachi, Ltd.
- Makoto Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetooptic anisotropy
- Patent number 4,298,284
- Issue date Nov 3, 1981
- Hitachi, Ltd.
- Manabu Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Element analyzer exploiting a magneto-optic effect
- Patent number 4,171,912
- Issue date Oct 23, 1979
- Hitachi, Ltd.
- Masaru Ito
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer employing magneto-optic effect
- Patent number 4,166,697
- Issue date Sep 4, 1979
- Hitachi, Ltd.
- Masaru Ito
- G01 - MEASURING TESTING

Seiichi Murayama

Person

Patents Grantslast 30 patents

X-ray exposure method with an X-ray mask comprising phase shifter s...

Circular fluorescent lamp

Plasma source mass spectrometer

Equipment for manufacturing semiconductor devices

Apparatus for generating light by utilizing microwave

Microwave plasma production apparatus

Trace element spectrometry with plasma source

Low-pressure discharge lamp

Plasma X-ray source

Compact fluorescent lamp

High-pressure discharge lamp operating circuit

Apparatus for thin film formation using photo-induced chemical reac...

Plasma x-ray source

Low-pressure mercury vapor discharge lamp

Method of photochemical surface treatment

Grazing incidence reflection spectrometer

Method of dry etching

Stain resistant fluorescent lamp

Plasma X-ray source

High intensity ultraviolet light source

Discharge lamp with neon gas in outer tube

Dry etching apparatus

Low-pressure mercury vapor discharge lamp

High-pressure discharge lamp operating circuit

Low-pressure mercury vapor discharge lamp

Liquid chromatography apparatus

Temperature control system for an element analyzer

Method and apparatus for measuring magnetooptic anisotropy

Element analyzer exploiting a magneto-optic effect

Spectrophotometer employing magneto-optic effect