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Seiichi Ohashi
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Probe card apparatus and electrical contact probe having curved or...
Patent number
6,842,023
Issue date
Jan 11, 2005
Innotech Corporation
Minoru Yoshida
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Probe card device and probe for use therein
Publication number
20030098700
Publication date
May 29, 2003
Minoru Yoshida
G01 - MEASURING TESTING