Seiichi Ohashi

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card apparatus and electrical contact probe having curved or...
- Patent number 6,842,023
- Issue date Jan 11, 2005
- Innotech Corporation
- Minoru Yoshida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card device and probe for use therein
- Publication number 20030098700
- Publication date May 29, 2003
- Minoru Yoshida
- G01 - MEASURING TESTING