Membership
Tour
Register
Log in
Seiichi Taguchi
Follow
Person
Kyoto, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit boundary scan test with multiplexe...
Patent number
5,225,834
Issue date
Jul 6, 1993
Matsushita Electric Industrial Co., Ltd.
Kiyoshi Imai
G01 - MEASURING TESTING