Seiji Akita

Person

Izumi-city, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Nanotube probe and method for manufacturing same
- Patent number 7,138,627
- Issue date Nov 21, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Coated nanotube surface signal probe
- Patent number 7,064,341
- Issue date Jun 20, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube cartridge and a method for manufacturing the same
- Patent number 6,892,432
- Issue date May 17, 2005
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Nanotweezers and nanomanipulator
- Patent number 6,805,390
- Issue date Oct 19, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanotweezers and nanomanipulator
- Patent number 6,802,549
- Issue date Oct 12, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Coated nanotube surface signal probe and method of attaching nanotu...
- Patent number 6,800,865
- Issue date Oct 5, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Conductive probe for scanning microscope and machining method using...
- Patent number 6,787,769
- Issue date Sep 7, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Sharpening method of nanotubes
- Patent number 6,777,637
- Issue date Aug 17, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe for scanning microscope produced by focused ion beam machining
- Patent number 6,759,653
- Issue date Jul 6, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Nanotube length control method
- Patent number 6,719,602
- Issue date Apr 13, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for vertical scanning microscope and probe for vertical...
- Patent number 6,705,154
- Issue date Mar 16, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Nanotweezers and nanomanipulator
- Patent number 6,669,256
- Issue date Dec 30, 2003
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Fusion-welded nanotube surface signal probe and method of attaching...
- Patent number 6,528,785
- Issue date Mar 4, 2003
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Nanosize Heater-Mounted Nozzle and Method for Manufacturing Same an...
- Publication number 20080113086
- Publication date May 15, 2008
- JURIDICAL FOUNDATION OSAKA INDUSTRIAL PROMOTION OR
- Seiji Akita
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Coated nanotube surface signal probe
- Publication number 20040168527
- Publication date Sep 2, 2004
- DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Electroconductive container of a nanotube product
- Publication number 20040079673
- Publication date Apr 29, 2004
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Nanotweezers and nanomanipulator
- Publication number 20030189350
- Publication date Oct 9, 2003
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanotweezers and nanomanipulator
- Publication number 20030189351
- Publication date Oct 9, 2003
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Sharpening method of nanotubes
- Publication number 20030186625
- Publication date Oct 2, 2003
- Daiken Chemical Co., Ltd and Yoshikazu Nakayama
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Application
Coated nanotube surface signal probe and method of attaching nanotu...
- Publication number 20030122073
- Publication date Jul 3, 2003
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Probe for scanning microscope produced by focused ion beam machining
- Publication number 20030029996
- Publication date Feb 13, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cantilever for vertical scanning microscope and probe for vertical...
- Publication number 20030010100
- Publication date Jan 16, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanotube length control method
- Publication number 20030010755
- Publication date Jan 16, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Conductive probe for scanning microscope and machining method using...
- Publication number 20030001091
- Publication date Jan 2, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanotweezers and nanomanipulator
- Publication number 20020158480
- Publication date Oct 31, 2002
- Yoshikazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanotube cartridge and a method for manufacturing the same
- Publication number 20020069505
- Publication date Jun 13, 2002
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY

Seiji Akita

Person

Patents Grantslast 30 patents

Nanotube probe and method for manufacturing same

Coated nanotube surface signal probe

Nanotube cartridge and a method for manufacturing the same

Nanotweezers and nanomanipulator

Nanotweezers and nanomanipulator

Coated nanotube surface signal probe and method of attaching nanotu...

Conductive probe for scanning microscope and machining method using...

Sharpening method of nanotubes

Probe for scanning microscope produced by focused ion beam machining

Nanotube length control method

Cantilever for vertical scanning microscope and probe for vertical...

Nanotweezers and nanomanipulator

Fusion-welded nanotube surface signal probe and method of attaching...

Patents Applicationslast 30 patents

Nanosize Heater-Mounted Nozzle and Method for Manufacturing Same an...

Coated nanotube surface signal probe

Electroconductive container of a nanotube product

Nanotweezers and nanomanipulator

Nanotweezers and nanomanipulator

Sharpening method of nanotubes

Coated nanotube surface signal probe and method of attaching nanotu...

Probe for scanning microscope produced by focused ion beam machining

Cantilever for vertical scanning microscope and probe for vertical...

Nanotube length control method

Conductive probe for scanning microscope and machining method using...

Nanotweezers and nanomanipulator

Nanotube cartridge and a method for manufacturing the same