Seiji Amanuma

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method
- Patent number 9,222,966
- Issue date Dec 29, 2015
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 9,057,756
- Issue date Jun 16, 2015
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and power supply apparatus
- Patent number 8,427,182
- Issue date Apr 23, 2013
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Switching circuit, signal output device and test apparatus
- Patent number 7,911,086
- Issue date Mar 22, 2011
- Advantest Corporation
- Seiji Amanuma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Switching circuit, signal output device and test apparatus
- Patent number 7,880,470
- Issue date Feb 1, 2011
- Advantest Corporation
- Seiji Amanuma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus/method for measuring the switching time of output signals...
- Patent number 7,550,976
- Issue date Jun 23, 2009
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, test apparatus, and measurement method
- Patent number 7,518,377
- Issue date Apr 14, 2009
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,471,092
- Issue date Dec 30, 2008
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,298,150
- Issue date Nov 20, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120217985
- Publication date Aug 30, 2012
- Advantest Corporation
- Seiji AMANUMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20120153977
- Publication date Jun 21, 2012
- Advantest Corporation
- Seiji AMANUMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND POWER SUPPLY APPARATUS
- Publication number 20110128020
- Publication date Jun 2, 2011
- Advantest Corporation
- Seiji AMANUMA
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS
- Publication number 20100052435
- Publication date Mar 4, 2010
- Advantest Corporation
- Seiji AMANUMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS
- Publication number 20100045115
- Publication date Feb 25, 2010
- Advantest Corporation
- Seiji AMANUMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS
- Publication number 20080238213
- Publication date Oct 2, 2008
- Advantest Corporation
- Seiji AMANUMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Measurement apparatus and measurement method
- Publication number 20070210823
- Publication date Sep 13, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus and test method
- Publication number 20070194794
- Publication date Aug 23, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus, test apparatus, and measurement method
- Publication number 20070197168
- Publication date Aug 23, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus and test method
- Publication number 20070194795
- Publication date Aug 23, 2007
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING

Seiji Amanuma

Person

Patents Grantslast 30 patents

Test apparatus and test method

Test apparatus

Test apparatus and power supply apparatus

Switching circuit, signal output device and test apparatus

Switching circuit, signal output device and test apparatus

Apparatus/method for measuring the switching time of output signals...

Measurement apparatus, test apparatus, and measurement method

Test apparatus and test method

Test apparatus and test method

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD

TEST APPARATUS

TEST APPARATUS AND POWER SUPPLY APPARATUS

SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS

SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS

SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS

Measurement apparatus and measurement method

Test apparatus and test method

Measurement apparatus, test apparatus, and measurement method

Test Apparatus and test method