Seiji Heike

Person

Hatoyama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and measuring method using same
- Patent number 9,423,416
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic force microscope and magnetic field observation method usi...
- Patent number 8,912,789
- Issue date Dec 16, 2014
- Hitachi, Ltd.
- Seiji Heike
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of coating substrate
- Patent number 7,799,701
- Issue date Sep 21, 2010
- Hitachi, Ltd.
- Seiji Heike
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Oscillator and frequency detector
- Patent number 7,557,662
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Seiji Heike
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electron exposure device and method and electronic characteristics...
- Patent number 6,670,622
- Issue date Dec 30, 2003
- Hitachi, Ltd.
- Seiji Heike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron exposure apparatus
- Patent number 6,366,340
- Issue date Apr 2, 2002
- Hitachi, Ltd.
- Masayoshi Ishibashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro-fabricated device with integrated electrostatic actuator
- Patent number 5,801,472
- Issue date Sep 1, 1998
- Hitchi, Ltd.
- Yasuo Wada
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer of fine connection structure for connecting an atom level ci...
- Patent number 5,694,059
- Issue date Dec 2, 1997
- Hitachi Ltd.
- Yasuo Wada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Solid surface observation method and apparatus therefor, and electr...
- Patent number 5,510,614
- Issue date Apr 23, 1996
- Hitachi, Ltd.
- Munehisa Mitsuya
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREM...
- Publication number 20150192604
- Publication date Jul 9, 2015
- Hitachi, Ltd
- Tsuyoshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20150177275
- Publication date Jun 25, 2015
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FORCE MICROSCOPE AND MAGNETIC FIELD OBSERVATION METHOD USI...
- Publication number 20120319679
- Publication date Dec 20, 2012
- Hitachi, Ltd
- Seiji HEIKE
- B82 - NANO-TECHNOLOGY
Information Patent Application
NEURAL ACTIVITY MEASUREMENT SYSTEM
- Publication number 20120185173
- Publication date Jul 19, 2012
- Hitachi, Ltd.
- Tsuyoshi YAMAMOTO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method of coating substrate
- Publication number 20080299292
- Publication date Dec 4, 2008
- Hitachi, Ltd.
- Seiji Heike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Oscillator and frequency detector
- Publication number 20080084248
- Publication date Apr 10, 2008
- Hitachi, Ltd.
- Seiji Heike
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electron exposure device and method and electronic characteristics...
- Publication number 20030107007
- Publication date Jun 12, 2003
- Hitachi, Ltd.
- Seiji Heike
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron exposure apparatus
- Publication number 20020101573
- Publication date Aug 1, 2002
- Hitachi, Ltd.
- Masayoshi Ishibashi
- B82 - NANO-TECHNOLOGY

Seiji Heike

Person

Patents Grantslast 30 patents

Scanning probe microscope and measuring method using same

Magnetic force microscope and magnetic field observation method usi...

Method of coating substrate

Oscillator and frequency detector

Electron exposure device and method and electronic characteristics...

Electron exposure apparatus

Micro-fabricated device with integrated electrostatic actuator

Buffer of fine connection structure for connecting an atom level ci...

Solid surface observation method and apparatus therefor, and electr...

Patents Applicationslast 30 patents

HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREM...

SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME

MAGNETIC FORCE MICROSCOPE AND MAGNETIC FIELD OBSERVATION METHOD USI...

NEURAL ACTIVITY MEASUREMENT SYSTEM

Method of coating substrate

Oscillator and frequency detector

Electron exposure device and method and electronic characteristics...

Electron exposure apparatus