Seiji Higuchi

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample dispersing device and sample dispersing method
- Patent number 12,117,379
- Issue date Oct 15, 2024
- Horiba, Ltd.
- Aya Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and a method to measure relative-position...
- Patent number 8,141,168
- Issue date Mar 20, 2012
- National Institute for Materials Science
- Tomonobu Nakayama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
LASER ANALYSIS DEVICE
- Publication number 20220390373
- Publication date Dec 8, 2022
- HORIBA, LTD.
- Aya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPERSING DEVICE AND SAMPLE DISPERSING METHOD
- Publication number 20210356365
- Publication date Nov 18, 2021
- HORIBA, Ltd.
- Aya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND A METHOD TO MEASURE RELATIVE POSITION...
- Publication number 20100005552
- Publication date Jan 7, 2010
- Tomonobu Nakayama
- G01 - MEASURING TESTING