Seiji Isogai

Person

Hitachinaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 8,428,336
- Issue date Apr 23, 2013
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,558,683
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect image classifying method and apparatus and a semiconductor d...
- Patent number 7,356,177
- Issue date Apr 8, 2008
- Hitachi, Ltd.
- Kenji Obara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing circuit pattern defects and a system thereof
- Patent number 7,352,890
- Issue date Apr 1, 2008
- Hitachi, Ltd.
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,253
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,254
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,305,314
- Issue date Dec 4, 2007
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect image classifying method and apparatus and a semiconductor d...
- Patent number 7,113,628
- Issue date Sep 26, 2006
- Hitachi
- Kenji Obara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting method, inspecting system, and method for manufacturing...
- Patent number 7,068,834
- Issue date Jun 27, 2006
- Hitachi, Ltd.
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for analyzing circuit pattern defects
- Patent number 7,062,081
- Issue date Jun 13, 2006
- Hitachi, Ltd.
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,010,447
- Issue date Mar 7, 2006
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Review work supporting system
- Patent number 6,978,041
- Issue date Dec 20, 2005
- Hitachi, Ltd.
- Seiji Isogai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 6,792,359
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Method for observing specimen and device therefor
- Patent number 6,756,589
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Kenji Obara
- G01 - MEASURING TESTING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope having magnification switching control
- Patent number 6,476,388
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Ryo Nakagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Image Classifying Method and Apparatus and a Semiconductor D...
- Publication number 20080187212
- Publication date Aug 7, 2008
- Hitachi, Ltd
- Kenji OBARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20080059083
- Publication date Mar 6, 2008
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect image classifying method and apparatus and a semiconductor d...
- Publication number 20060274933
- Publication date Dec 7, 2006
- Hitachi, Ltd
- Kenji Obara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting method, inspecting system, and method for manufacturing...
- Publication number 20060274932
- Publication date Dec 7, 2006
- Yoko Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for analyzing circuit pattern defects and a system thereof
- Publication number 20060140472
- Publication date Jun 29, 2006
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20060100804
- Publication date May 11, 2006
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning electron microscope
- Publication number 20060043294
- Publication date Mar 2, 2006
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20050236569
- Publication date Oct 27, 2005
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20040260496
- Publication date Dec 23, 2004
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Review work supporting system
- Publication number 20020196968
- Publication date Dec 26, 2002
- Seiji Isogai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20020035435
- Publication date Mar 21, 2002
- Takanori Ninomiya
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing circuit pattern defects and a system thereof
- Publication number 20010016061
- Publication date Aug 23, 2001
- Atsushi Shimoda
- G06 - COMPUTING CALCULATING COUNTING

Seiji Isogai

Person

Patents Grantslast 30 patents

Defect image processing apparatus, defect image processing method,...

Inspecting method, inspecting system, and method for manufacturing...

Method for inspecting defect and system therefor

Defect image classifying method and apparatus and a semiconductor d...

Method for analyzing circuit pattern defects and a system thereof

Scanning electron microscope

Scanning electron microscope

Method for inspecting defect and system therefor

Defect image classifying method and apparatus and a semiconductor d...

Inspecting method, inspecting system, and method for manufacturing...

Method and system for analyzing circuit pattern defects

Method for inspecting defect and system therefor

Review work supporting system

Method for inspecting defect and system therefor

Process management system

Method for observing specimen and device therefor

Process control system

Scanning electron microscope having magnification switching control

Patents Applicationslast 30 patents

DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...

Defect Image Classifying Method and Apparatus and a Semiconductor D...

Method for inspecting defect and system therefor

Defect image classifying method and apparatus and a semiconductor d...

Inspecting method, inspecting system, and method for manufacturing...

Method for analyzing circuit pattern defects and a system thereof

Method for inspecting defect and system therefor

Scanning electron microscope

Scanning electron microscope

Method for inspecting defect and system therefor

Process management system

Review work supporting system

Method for inspecting defect and system therefor

Method for analyzing circuit pattern defects and a system thereof