Seiji Kajihara

Person

Fukuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test pattern generation device, fault detection system, test patter...
- Patent number 9,702,927
- Issue date Jul 11, 2017
- Japan Science and Technology Agency
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection system, generation circuit, and program
- Patent number 9,383,408
- Issue date Jul 5, 2016
- Japan Science and Technology Agency
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, detection method and program
- Patent number 9,316,684
- Issue date Apr 19, 2016
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection system, acquisition apparatus, fault detection meth...
- Patent number 9,075,110
- Issue date Jul 7, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Don't-care-bit identification method and don't-care-bit identificat...
- Patent number 8,589,751
- Issue date Nov 19, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Target logic value determination method for unspecified bit in test...
- Patent number 8,453,023
- Issue date May 28, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, and program
- Patent number 8,429,472
- Issue date Apr 23, 2013
- National University Corporation Kyushu University Institute of Technology
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test program of semiconductor logic circuit device
- Patent number 8,117,513
- Issue date Feb 14, 2012
- LPTEX Corporation
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Conversion device, conversion method, program, and recording medium
- Patent number 8,037,387
- Issue date Oct 11, 2011
- Japan Science and Technology Agency
- Seiji Kajihara
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation method for avoiding false testing in two-pa...
- Patent number 8,001,437
- Issue date Aug 16, 2011
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,979,765
- Issue date Jul 12, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G11 - INFORMATION STORAGE
Information Patent Grant
Conversion device, conversion method, program, and recording medium
- Patent number 7,971,118
- Issue date Jun 28, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,962,822
- Issue date Jun 14, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device, diagnostic method, program, and recording medium
- Patent number 7,913,144
- Issue date Mar 22, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Test vector generating method and test vector generating program of...
- Patent number 7,743,306
- Issue date Jun 22, 2010
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of fault diagnosis for integrated logic circuits
- Patent number 7,478,295
- Issue date Jan 13, 2009
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating delay test quality
- Patent number 7,159,143
- Issue date Jan 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test pattern for semiconductor integrated cir...
- Patent number 6,799,292
- Issue date Sep 28, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION SYSTEM, GENERATION CIRCUIT, AND PROGRAM
- Publication number 20150247898
- Publication date Sep 3, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION DEVICE, FAULT DETECTION SYSTEM, TEST PATTER...
- Publication number 20150006102
- Publication date Jan 1, 2015
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION SYSTEM, ACQUISITION APPARATUS, FAULT DETECTION METH...
- Publication number 20130205180
- Publication date Aug 8, 2013
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, DETECTION METHOD AND PROGRAM
- Publication number 20130013247
- Publication date Jan 10, 2013
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, AND PROGRAM
- Publication number 20110140734
- Publication date Jun 16, 2011
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Application
DON'T-CARE-BIT IDENTIFICATION METHOD AND DON'T-CARE-BIT IDENTIFICAT...
- Publication number 20100218063
- Publication date Aug 26, 2010
- Kyushu Institute of Technology
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Application
LOGIC VALUE DETERMINATION METHOD AND LOGIC VALUE DETERMINATION PROGRAM
- Publication number 20100205491
- Publication date Aug 12, 2010
- Kyushu Institute of Technology
- Kohei Miyase
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST PATTERN GENERATION METHOD FOR AVOIDING FALSE TESTING IN TWO-PA...
- Publication number 20100095179
- Publication date Apr 15, 2010
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20100064191
- Publication date Mar 11, 2010
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090319842
- Publication date Dec 24, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Test vector generating method and test vector generating program of...
- Publication number 20090259898
- Publication date Oct 15, 2009
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20090113261
- Publication date Apr 30, 2009
- Japan Science and Technology Agency
- Seiji Kajihara
- G01 - MEASURING TESTING
Information Patent Application
Test Method and Test Program of Semiconductor Logic Circuit Device
- Publication number 20090083593
- Publication date Mar 26, 2009
- Kyushu Institute of Technology
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090019327
- Publication date Jan 15, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20080235543
- Publication date Sep 25, 2008
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus of fault diagnosis for integrated logic circuits
- Publication number 20060107157
- Publication date May 18, 2006
- Kyushu Institute of Technology
- Xiaoquing Wen
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating delay test quality
- Publication number 20050028051
- Publication date Feb 3, 2005
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method for generating test pattern for semiconductor integrated cir...
- Publication number 20010029593
- Publication date Oct 11, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sadami Takeoka
- G01 - MEASURING TESTING

Seiji Kajihara

Person

Patents Grantslast 30 patents

Test pattern generation device, fault detection system, test patter...

Fault detection system, generation circuit, and program

Semiconductor device, detection method and program

Fault detection system, acquisition apparatus, fault detection meth...

Don't-care-bit identification method and don't-care-bit identificat...

Target logic value determination method for unspecified bit in test...

Generating device, generating method, and program

Test method and test program of semiconductor logic circuit device

Conversion device, conversion method, program, and recording medium

Test pattern generation method for avoiding false testing in two-pa...

Generating device, generating method, program and recording medium

Conversion device, conversion method, program, and recording medium

Generating device, generating method, program and recording medium

Diagnostic device, diagnostic method, program, and recording medium

Test vector generating method and test vector generating program of...

Method and apparatus of fault diagnosis for integrated logic circuits

Method for evaluating delay test quality

Method for generating test pattern for semiconductor integrated cir...

Patents Applicationslast 30 patents

FAULT DETECTION SYSTEM, GENERATION CIRCUIT, AND PROGRAM

TEST PATTERN GENERATION DEVICE, FAULT DETECTION SYSTEM, TEST PATTER...

FAULT DETECTION SYSTEM, ACQUISITION APPARATUS, FAULT DETECTION METH...

SEMICONDUCTOR DEVICE, DETECTION METHOD AND PROGRAM

GENERATING DEVICE, GENERATING METHOD, AND PROGRAM

DON'T-CARE-BIT IDENTIFICATION METHOD AND DON'T-CARE-BIT IDENTIFICAT...

LOGIC VALUE DETERMINATION METHOD AND LOGIC VALUE DETERMINATION PROGRAM

TEST PATTERN GENERATION METHOD FOR AVOIDING FALSE TESTING IN TWO-PA...

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

Test vector generating method and test vector generating program of...

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

Test Method and Test Program of Semiconductor Logic Circuit Device

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

Method and apparatus of fault diagnosis for integrated logic circuits

Method for evaluating delay test quality

Method for generating test pattern for semiconductor integrated cir...