Seiji Kamba

Person

Nagaokakyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Separation recovery system and separation recovery method
- Patent number 11,833,455
- Issue date Dec 5, 2023
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Filtration filter
- Patent number 11,202,996
- Issue date Dec 21, 2021
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Aperture array and production method therefor
- Patent number 11,041,787
- Issue date Jun 22, 2021
- Murata Manufacturing Co., Ltd.
- Naoki Kawara
- G01 - MEASURING TESTING
Information Patent Grant
Filtration filter
- Patent number 10,729,993
- Issue date Aug 4, 2020
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Void-arranged structure and measurement method using the same
- Patent number 10,408,750
- Issue date Sep 10, 2019
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and measurement system
- Patent number 10,408,751
- Issue date Sep 10, 2019
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Filtration filter
- Patent number 10,399,042
- Issue date Sep 3, 2019
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Extraction method, analytical method, extraction device, and analyt...
- Patent number 10,266,875
- Issue date Apr 23, 2019
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Fixing instrument and metal mesh device
- Patent number 10,215,947
- Issue date Feb 26, 2019
- MURATA MANUFACTURING CO., LTD.
- Yoshiji Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Specimen measuring method
- Patent number 9,366,620
- Issue date Jun 14, 2016
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Aperture array structure and measurement method using the same
- Patent number 9,341,561
- Issue date May 17, 2016
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Perforated-structure body, manufacturing method therefor, and measu...
- Patent number 9,329,125
- Issue date May 3, 2016
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and feature measurement method of object to be m...
- Patent number 9,075,006
- Issue date Jul 7, 2015
- MURATA MANUFACTRURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring characteristics of object
- Patent number 9,063,078
- Issue date Jun 23, 2015
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of properties of analyte
- Patent number 9,007,578
- Issue date Apr 14, 2015
- MURATA MANUFACTURING CO., LTD.
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement structure, method of manufacturing same, and measuring...
- Patent number 8,912,497
- Issue date Dec 16, 2014
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristics of specimen, and flat-plate per...
- Patent number 8,610,071
- Issue date Dec 17, 2013
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis method
- Patent number 8,514,403
- Issue date Aug 20, 2013
- TOHOKU UNIVERSITY
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristics of specimen and flat-plate peri...
- Patent number 8,304,732
- Issue date Nov 6, 2012
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring characteristic of object to be measured, struc...
- Patent number 8,269,967
- Issue date Sep 18, 2012
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Dual-mode band-pass filter
- Patent number 6,630,875
- Issue date Oct 7, 2003
- Murata Manufacturing Co., Ltd.
- Naoki Mizoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-mode band-pass filter
- Patent number 6,545,568
- Issue date Apr 8, 2003
- Murata Manufacturing Co., Ltd.
- Naoki Mizoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-mode band-pass filter
- Patent number 6,507,251
- Issue date Jan 14, 2003
- Murata Manufacturing Co., Ltd.
- Naoki Mizoguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEPARATION RECOVERY SYSTEM AND SEPARATION RECOVERY METHOD
- Publication number 20230116829
- Publication date Apr 13, 2023
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILTER AND FILTER DEVICE
- Publication number 20230073215
- Publication date Mar 9, 2023
- Murata Manufacturing Co., Ltd.
- Seiji KAMBA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SEPARATION RECOVERY SYSTEM AND SEPARATION RECOVERY METHOD
- Publication number 20200298150
- Publication date Sep 24, 2020
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILTRATION FILTER
- Publication number 20190336919
- Publication date Nov 7, 2019
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILTRATION FILTER
- Publication number 20170216744
- Publication date Aug 3, 2017
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
APERTURE ARRAY AND PRODUCTION METHOD THEREFOR
- Publication number 20170212022
- Publication date Jul 27, 2017
- Murata Manufacturing Co., Ltd.
- NAOKI KAWARA
- G01 - MEASURING TESTING
Information Patent Application
FILTRATION FILTER
- Publication number 20170203260
- Publication date Jul 20, 2017
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
EXTRACTION METHOD, ANALYTICAL METHOD, EXTRACTION DEVICE, AND ANALYT...
- Publication number 20170191114
- Publication date Jul 6, 2017
- Murata Manufacturing Co., Ltd.
- SEIJI KAMBA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20170074790
- Publication date Mar 16, 2017
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
FIXING INSTRUMENT AND METAL MESH DEVICE
- Publication number 20160124177
- Publication date May 5, 2016
- Murata Manufacturing Co., Ltd.
- Yoshiji Okamoto
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASURING ANALYTE
- Publication number 20160054223
- Publication date Feb 25, 2016
- Murata Manufacturing Co., Ltd.
- Seiji KAMBA
- G01 - MEASURING TESTING
Information Patent Application
FILTER DEVICE AND MEASURING APPARATUS
- Publication number 20160041075
- Publication date Feb 11, 2016
- Murata Manufacturing Co., Ltd.
- Seiji KAMBA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20160011104
- Publication date Jan 14, 2016
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD
- Publication number 20150323453
- Publication date Nov 12, 2015
- Murata Manufacturing Co., Ltd.
- SEIJI KAMBA
- G01 - MEASURING TESTING
Information Patent Application
DROPLET QUANTITY DETERMINATION METHOD AND MEASURING DEVICE
- Publication number 20150211996
- Publication date Jul 30, 2015
- Murata Manufacturing Co., Ltd.
- SEIJI KAMBA
- G01 - MEASURING TESTING
Information Patent Application
PERFORATED-STRUCTURE BODY, MANUFACTURING METHOD THEREFOR, AND MEASU...
- Publication number 20150198527
- Publication date Jul 16, 2015
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G02 - OPTICS
Information Patent Application
APERTURE ARRAY STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20150136989
- Publication date May 21, 2015
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G02 - OPTICS
Information Patent Application
Measurement Method for Object to be Measured
- Publication number 20150129769
- Publication date May 14, 2015
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD FOR OBJECT TO BE MEASURED AND MEASUREMENT DEVICE...
- Publication number 20150123001
- Publication date May 7, 2015
- Murata Manufacturing Co., Ltd.
- Makoto Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND FEATURE MEASUREMENT METHOD OF OBJECT TO BE M...
- Publication number 20140252235
- Publication date Sep 11, 2014
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20140247452
- Publication date Sep 4, 2014
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN MEASURING METHOD
- Publication number 20140084164
- Publication date Mar 27, 2014
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT STRUCTURE, METHOD OF MANUFACTURING SAME, AND MEASURING...
- Publication number 20140021353
- Publication date Jan 23, 2014
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PER...
- Publication number 20130221209
- Publication date Aug 29, 2013
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...
- Publication number 20130062524
- Publication date Mar 14, 2013
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN AND SENSING DEVICE...
- Publication number 20130011935
- Publication date Jan 10, 2013
- Murata Manufacturing Co., Ltd.
- Koji Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Characteristics of Object
- Publication number 20120262190
- Publication date Oct 18, 2012
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Characteristics of Specimen and Flat-Plate Peri...
- Publication number 20120153159
- Publication date Jun 21, 2012
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE
- Publication number 20120137755
- Publication date Jun 7, 2012
- National University Corporation, Tohoku University
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Characteristics of Specimen, Measuring Device,...
- Publication number 20120126123
- Publication date May 24, 2012
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING

Seiji Kamba

Person

Patents Grantslast 30 patents

Separation recovery system and separation recovery method

Filtration filter

Aperture array and production method therefor

Filtration filter

Void-arranged structure and measurement method using the same

Measurement method and measurement system

Filtration filter

Extraction method, analytical method, extraction device, and analyt...

Fixing instrument and metal mesh device

Specimen measuring method

Aperture array structure and measurement method using the same

Perforated-structure body, manufacturing method therefor, and measu...

Measurement device and feature measurement method of object to be m...

Method and apparatus for measuring characteristics of object

Method for measurement of properties of analyte

Measurement structure, method of manufacturing same, and measuring...

Method of measuring characteristics of specimen, and flat-plate per...

Sample analysis method

Method of measuring characteristics of specimen and flat-plate peri...

Method for measuring characteristic of object to be measured, struc...

Dual-mode band-pass filter

Dual-mode band-pass filter

Dual-mode band-pass filter

Patents Applicationslast 30 patents

SEPARATION RECOVERY SYSTEM AND SEPARATION RECOVERY METHOD

FILTER AND FILTER DEVICE

SEPARATION RECOVERY SYSTEM AND SEPARATION RECOVERY METHOD

FILTRATION FILTER

FILTRATION FILTER

APERTURE ARRAY AND PRODUCTION METHOD THEREFOR

FILTRATION FILTER

EXTRACTION METHOD, ANALYTICAL METHOD, EXTRACTION DEVICE, AND ANALYT...

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

FIXING INSTRUMENT AND METAL MESH DEVICE

METHOD FOR MEASURING ANALYTE

FILTER DEVICE AND MEASURING APPARATUS

VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING THE SAME

VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD

DROPLET QUANTITY DETERMINATION METHOD AND MEASURING DEVICE

PERFORATED-STRUCTURE BODY, MANUFACTURING METHOD THEREFOR, AND MEASU...

APERTURE ARRAY STRUCTURE AND MEASUREMENT METHOD USING THE SAME

Measurement Method for Object to be Measured

MEASUREMENT METHOD FOR OBJECT TO BE MEASURED AND MEASUREMENT DEVICE...

MEASUREMENT DEVICE AND FEATURE MEASUREMENT METHOD OF OBJECT TO BE M...

PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME

SPECIMEN MEASURING METHOD

MEASUREMENT STRUCTURE, METHOD OF MANUFACTURING SAME, AND MEASURING...

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PER...

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN AND SENSING DEVICE...

Method and Apparatus for Measuring Characteristics of Object

Method of Measuring Characteristics of Specimen and Flat-Plate Peri...

METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE

Method of Measuring Characteristics of Specimen, Measuring Device,...