Seiji KANAZAWA

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Aomori, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing integrated circuit
- Patent number 8,680,880
- Issue date Mar 25, 2014
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
- Publication number 20100164520
- Publication date Jul 1, 2010
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING