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Patents Grants
last 30 patents
Information
Patent Grant
Infrared ray sensor package, infrared ray sensor module, and electr...
Patent number
9,157,805
Issue date
Oct 13, 2015
NEC Corporation
Takao Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Bolometer type Terahertz wave detector
Patent number
8,618,483
Issue date
Dec 31, 2013
NEC Corporation
Seiji Kurashina
G01 - MEASURING TESTING
Information
Patent Grant
Bolometer-type THz wave detector
Patent number
8,541,742
Issue date
Sep 24, 2013
NEC Corporation
Seiji Kurashina
G01 - MEASURING TESTING
Information
Patent Grant
Encapsulating package, printed circuit board, electronic device and...
Patent number
8,525,323
Issue date
Sep 3, 2013
NEC Corporation
Takao Yamazaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Infrared sensor and manufacturing method thereof
Patent number
8,215,832
Issue date
Jul 10, 2012
NEC Corporation
Seiji Kurashina
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum package and manufacturing process thereof
Patent number
7,795,585
Issue date
Sep 14, 2010
NEC Corporation
Yoshimichi Sogawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Infrared sensor manufacturing method suitable for mass production
Patent number
7,781,030
Issue date
Aug 24, 2010
National Institute of Advanced Industrial Science and Technology
Tetsuo Tsuchiya
G01 - MEASURING TESTING
Information
Patent Grant
Thermal-type infra-red ray solid-state image sensor and method of f...
Patent number
7,276,698
Issue date
Oct 2, 2007
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic head and method for magnetic recording and playback
Patent number
6,137,663
Issue date
Oct 24, 2000
NEC Corporation
Seiji Kurashina
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
TERAHERTZ-WAVE DETECTOR
Publication number
20170030775
Publication date
Feb 2, 2017
NEC Corporation
Seiji KURASHINA
G01 - MEASURING TESTING
Information
Patent Application
INFRARED SENSOR MANUFACTURED BY METHOD SUITABLE FOR MASS PRODUCTION
Publication number
20160238453
Publication date
Aug 18, 2016
Tetsuo TSUCHIYA
G01 - MEASURING TESTING
Information
Patent Application
VACUUM SEALED PACKAGE, PRINTED CIRCUIT BOARD HAVING VACUUM SEALED P...
Publication number
20140022718
Publication date
Jan 23, 2014
NEC Corporation
TAKAO YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
INFRARED RAY SENSOR PACKAGE, INFRARED RAY SENSOR MODULE, AND ELECTR...
Publication number
20130306868
Publication date
Nov 21, 2013
NEC Corporation
Takao YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
BOLOMETER-TYPE THz WAVE DETECTOR
Publication number
20120235045
Publication date
Sep 20, 2012
Seiji Kurashina
G01 - MEASURING TESTING
Information
Patent Application
VACUUM SEALED PACKAGE, PRINTED CIRCUIT BOARD HAVING VACUUM SEALED P...
Publication number
20120106085
Publication date
May 3, 2012
Takao Yamazaki
G01 - MEASURING TESTING
Information
Patent Application
BOLOMETER TYPE TERAHERTZ WAVE DETECTOR
Publication number
20110303847
Publication date
Dec 15, 2011
Seiji Kurashina
G01 - MEASURING TESTING
Information
Patent Application
ENCAPSULATING PACKAGE, PRINTED CIRCUIT BOARD, ELECTRONIC DEVICE AND...
Publication number
20110114840
Publication date
May 19, 2011
Takao Yamazaki
G01 - MEASURING TESTING
Information
Patent Application
INFRARED SENSOR MANUFACTURED BY METHOD SUITABLE FOR MASS PRODUCTION
Publication number
20100276593
Publication date
Nov 4, 2010
NEC Corporation
Tetsuo TSUCHIYA
G01 - MEASURING TESTING
Information
Patent Application
INFRARED SENSOR AND MANUFACTURING METHOD THEREOF
Publication number
20090207879
Publication date
Aug 20, 2009
SEIJI KURASHINA
G01 - MEASURING TESTING
Information
Patent Application
VACUUM PACKAGE AND MANUFACTURING PROCESS THEREOF
Publication number
20090140146
Publication date
Jun 4, 2009
NEC Corporation
Yoshimichi SOGAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Infrared sensor manufacturing method suitable for mass production
Publication number
20070272863
Publication date
Nov 29, 2007
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIECE AND TECHNOLOGY
Tetsuo Tsuchiya
G01 - MEASURING TESTING
Information
Patent Application
Thermal-type infra-red ray solid-state image sensor and method of f...
Publication number
20050218326
Publication date
Oct 6, 2005
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING
Information
Patent Application
Thermal-type infra-red ray solid-state image sensor and method of f...
Publication number
20050116169
Publication date
Jun 2, 2005
NEC Corporation
Shigeru Tohyama
G01 - MEASURING TESTING