Seiji Makino

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Exposure method and method of making a semiconductor device
- Patent number 8,298,732
- Issue date Oct 30, 2012
- Fujitsu Semiconductor Limited
- Masahiko Minemura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern verification method, pattern verification apparatus, and pa...
- Patent number 8,280,147
- Issue date Oct 2, 2012
- Fujitsu Semiconductor Limited
- Mitsufumi Naoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device having a dummy pattern
- Patent number 7,242,095
- Issue date Jul 10, 2007
- Fujitsu Limited
- Katsuji Tabara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern image comparison method, pattern image comparison device, a...
- Patent number 7,146,035
- Issue date Dec 5, 2006
- Fujitsu Limited
- Tomoyuki Okada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EXPOSURE METHOD AND METHOD OF MAKING A SEMICONDUCTOR DEVICE
- Publication number 20110207053
- Publication date Aug 25, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Masahiko Minemura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN VERIFICATION METHOD, PATTERN VERIFICATION APPARATUS, AND PA...
- Publication number 20100232679
- Publication date Sep 16, 2010
- FUJITSU MICROELECTRONICS LIMITED
- Mitsufumi Naoe
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device having a dummy pattern
- Publication number 20050173802
- Publication date Aug 11, 2005
- FUJITSU LIMITED
- Katsuji Tabara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern image comparison method, pattern image comparison device, a...
- Publication number 20030228048
- Publication date Dec 11, 2003
- FUJITSU LIMITED
- Tomoyuki Okada
- G06 - COMPUTING CALCULATING COUNTING