Seiji Sakagami

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Absolute linear encoder
- Patent number 7,432,497
- Issue date Oct 7, 2008
- Mitutoyo Corporation
- Seiji Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Linear scale attachment device and attachment method
- Patent number 7,225,555
- Issue date Jun 5, 2007
- Mitutoyo Corporation
- Hiroaki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder
- Patent number 6,635,863
- Issue date Oct 21, 2003
- Mitutoyo Corporation
- Shingo Nihommori
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction-type optical encoder with improved detection signal ins...
- Patent number 4,985,623
- Issue date Jan 15, 1991
- Mitytoyo Corporation
- Souji Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction type optical encoder with improved detection signal ins...
- Patent number 4,983,825
- Issue date Jan 8, 1991
- Mitutoyo Corporation
- Souji Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction-type optical encoder with improved detection signal ins...
- Patent number 4,943,716
- Issue date Jul 24, 1990
- Mitutoyo Corporation
- Souji Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Linear scale type displacement measuring instrument
- Patent number 4,603,480
- Issue date Aug 5, 1986
- Mitutoyo Mfg. Co., Ltd.
- Seiji Sakagami
- G01 - MEASURING TESTING
Information Patent Grant
Seal device in displacement measuring instrument
- Patent number 4,500,097
- Issue date Feb 19, 1985
- Mitutoyo Mfg. Co., Ltd.
- Hitoshi Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Contour measuring instrument
- Patent number 4,377,911
- Issue date Mar 29, 1983
- Mitutoyo Mfg. Co., Ltd.
- Jynichi Iida
- G01 - MEASURING TESTING
Information Patent Grant
Dust excluding device
- Patent number 4,376,543
- Issue date Mar 15, 1983
- Mitutoyo Mfg. Co., Ltd.
- Seiji Sakagami
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ABSOLUTE LINEAR ENCODER
- Publication number 20070069117
- Publication date Mar 29, 2007
- Mitutoyo Corporation
- Seiji Sakagami
- G01 - MEASURING TESTING
Information Patent Application
Linear scale attachment device and attachment method
- Publication number 20060016089
- Publication date Jan 26, 2006
- Mitutoyo Corporation
- Hiroaki Kawada
- G01 - MEASURING TESTING

Seiji Sakagami

Person

Patents Grantslast 30 patents

Absolute linear encoder

Linear scale attachment device and attachment method

Optical encoder

Diffraction-type optical encoder with improved detection signal ins...

Diffraction type optical encoder with improved detection signal ins...

Diffraction-type optical encoder with improved detection signal ins...

Linear scale type displacement measuring instrument

Seal device in displacement measuring instrument

Contour measuring instrument

Dust excluding device

Patents Applicationslast 30 patents

ABSOLUTE LINEAR ENCODER

Linear scale attachment device and attachment method