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Tochigi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor device and system, and biometric sensing method and system
Patent number
11,448,745
Issue date
Sep 20, 2022
Asahi Kasei Microdevices Corporation
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and device manufacturing method using original w...
Patent number
9,164,370
Issue date
Oct 20, 2015
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measurement apparatus, exposure apparatus, and device fabrication m...
Patent number
7,688,424
Issue date
Mar 30, 2010
Canon Kabushiki Kaisha
Yumiko Ohsaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and device manufacturing method using a common p...
Patent number
7,675,629
Issue date
Mar 9, 2010
Canon Kabushiki Kaisha
Yumiko Ohsaki
G02 - OPTICS
Information
Patent Grant
Exposure apparatus and device manufacturing method
Patent number
7,573,563
Issue date
Aug 11, 2009
Canon Kabushiki Kaisha
Kenji Yamazoe
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus and device manufacturing method
Patent number
7,508,493
Issue date
Mar 24, 2009
Canon Kabushiki Kaisha
Seiji Takeuchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Exposure apparatus and device manufacturing method using the apparatus
Patent number
7,466,395
Issue date
Dec 16, 2008
Canon Kabushiki Kaisha
Yumiko Ohsaki
G01 - MEASURING TESTING
Information
Patent Grant
Phase measuring method and apparatus for measuring characterization...
Patent number
7,327,467
Issue date
Feb 5, 2008
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring birefringence
Patent number
7,286,226
Issue date
Oct 23, 2007
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Optical element and manufacturing method therefor
Patent number
7,262,920
Issue date
Aug 28, 2007
Canon Kabushiki Kaisha
Yasuyuki Unno
G02 - OPTICS
Information
Patent Grant
Birefringence measurement apparatus, strain remover, polarimeter an...
Patent number
7,251,029
Issue date
Jul 31, 2007
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Polarization state detecting system, light source, and exposure app...
Patent number
7,180,051
Issue date
Feb 20, 2007
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
Patent number
7,161,675
Issue date
Jan 9, 2007
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Grant
Optical element and manufacturing method thereof
Patent number
7,102,828
Issue date
Sep 5, 2006
Canon Kabushiki Kaisha
Yasuyuki Unno
G02 - OPTICS
Information
Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
Patent number
7,095,497
Issue date
Aug 22, 2006
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Grant
Phase measurement apparatus for measuring characterization of optic...
Patent number
7,030,998
Issue date
Apr 18, 2006
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Exposure apparatus that acquires information regarding a polarizati...
Patent number
7,015,456
Issue date
Mar 21, 2006
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
Patent number
6,992,763
Issue date
Jan 31, 2006
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Grant
Optical element and optical system
Patent number
6,967,796
Issue date
Nov 22, 2005
Canon Kabushiki Kaisha
Seiji Takeuchi
G02 - OPTICS
Information
Patent Grant
Stocker, exposure apparatus, device manufacturing method, semicondu...
Patent number
6,826,442
Issue date
Nov 30, 2004
Canon Kabushiki Kaisha
Seiji Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Exposure apparatus
Patent number
6,594,012
Issue date
Jul 15, 2003
Canon Kabushiki Kaisha
Seiji Takeuchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical inspection method and apparatus including intensity modulat...
Patent number
5,861,952
Issue date
Jan 19, 1999
Canon Kabushiki Kaisha
Toshihiko Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Exposure state detecting system and exposure apparatus using the same
Patent number
5,777,744
Issue date
Jul 7, 1998
Canon Kabushiki Kaisha
Minoru Yoshii
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Inspection system and device manufacturing method using the same
Patent number
5,767,962
Issue date
Jun 16, 1998
Canon Kabushiki Kaisha
Masayuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Best focus determining method
Patent number
5,750,294
Issue date
May 12, 1998
Canon Kabushiki Kaisha
Masanobu Hasegawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus for detecting foreign matter on a substrate, and an expos...
Patent number
5,742,386
Issue date
Apr 21, 1998
Canon Kabushiki Kaisha
Noriyuki Nose
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system for original with pellicle
Patent number
5,652,657
Issue date
Jul 29, 1997
Canon Kabushiki Kaisha
Minoru Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detecting system, an expose apparatus, and a device ma...
Patent number
5,610,715
Issue date
Mar 11, 1997
Canon Kabushiki Kaisha
Minoru Yoshii
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Foreign particle inspecting system
Patent number
5,585,918
Issue date
Dec 17, 1996
Canon Kabushiki Kaisha
Seiji Takeuchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measuring apparatus utilizing diffraction of reflected and transmit...
Patent number
5,541,729
Issue date
Jul 30, 1996
Canon Kabushiki Kaisha
Seiji Takeuchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
SENSOR DEVICE, SYSTEM, AND SOUND DETECTION METHOD
Publication number
20230305134
Publication date
Sep 28, 2023
ASAHI KASEI MICRODEVICES CORPORATION
Seiji TAKEUCHI
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
SENSOR DEVICE AND SYSTEM, AND BIOMETRIC SENSING METHOD AND SYSTEM
Publication number
20190391249
Publication date
Dec 26, 2019
ASAHI KASEI MICRODEVICES CORPORATION
Seiji TAKEUCHI
G01 - MEASURING TESTING
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20090257039
Publication date
Oct 15, 2009
Canon Kabushiki Kaisha
Yasuhiro Kishikawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
Publication number
20090066925
Publication date
Mar 12, 2009
Canon Kabushiki Kaisha
Yumiko Ohsaki
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20080062427
Publication date
Mar 13, 2008
Canon Kabushiki Kaisha
Yumiko Ohsaki
G02 - OPTICS
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20070188730
Publication date
Aug 16, 2007
Seiji Takeuchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD USING THE APPARATUS
Publication number
20070019175
Publication date
Jan 25, 2007
Canon Kabushiki Kaisha
Yumiko Ohsaki
G01 - MEASURING TESTING
Information
Patent Application
Exposure apparatus and method, measuring apparatus, and device manu...
Publication number
20060210911
Publication date
Sep 21, 2006
Kenji Yamazoe
G01 - MEASURING TESTING
Information
Patent Application
Phase measuring method and apparatus for measuring characterization...
Publication number
20060055940
Publication date
Mar 16, 2006
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Polarization state detecting system, light source, and exposure app...
Publication number
20060033019
Publication date
Feb 16, 2006
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
Publication number
20040223228
Publication date
Nov 11, 2004
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
Publication number
20040223443
Publication date
Nov 11, 2004
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Application
Method and apparatus for measuring birefringence
Publication number
20040156051
Publication date
Aug 12, 2004
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Optical element and manufacturing method therefor
Publication number
20040136084
Publication date
Jul 15, 2004
Yasuyuki Unno
C30 - CRYSTAL GROWTH
Information
Patent Application
Birefringence measurement apparatus, strain remover, polarimeter an...
Publication number
20040008348
Publication date
Jan 15, 2004
Yasuhiro Kishikawa
G01 - MEASURING TESTING
Information
Patent Application
Polarization state detecting system, light source, and exposure app...
Publication number
20030234348
Publication date
Dec 25, 2003
Canon Kabushiki Kaisha
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Phase measuring method and apparatus
Publication number
20030144819
Publication date
Jul 31, 2003
Seiji Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
Publication number
20030043376
Publication date
Mar 6, 2003
Yasuhiro Kishikawa
G02 - OPTICS
Information
Patent Application
Optical element and manufacturing method thereof
Publication number
20030000453
Publication date
Jan 2, 2003
Yasuyuki Unno
C30 - CRYSTAL GROWTH
Information
Patent Application
EXPOSURE APPARATUS
Publication number
20020093656
Publication date
Jul 18, 2002
SEIJI TAKEUCHI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
OPTICAL ELEMENT AND OPTICAL SYSTEM
Publication number
20020044345
Publication date
Apr 18, 2002
SEIJI TAKEUCHI
G02 - OPTICS
Information
Patent Application
Stocker, exposure apparatus, device manufacturing method, semicondu...
Publication number
20010027351
Publication date
Oct 4, 2001
Seiji Takeuchi
H01 - BASIC ELECTRIC ELEMENTS