Seiji Yasuda

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation method for semiconductor device
- Patent number 4,968,932
- Issue date Nov 6, 1990
- Kabushiki Kaisha Toshiba
- Yoshiro Baba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device monolithically comprising a V-MOSFET and bipol...
- Patent number 4,589,004
- Issue date May 13, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Seiji Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 4,566,174
- Issue date Jan 28, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Seiji Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 4,403,392
- Issue date Sep 13, 1983
- Tokyo Shibaura Denki Kabushiki Kaisha
- Jiro Oshima
- H01 - BASIC ELECTRIC ELEMENTS