Seiko Omori

Follow

Person

Ashiya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample observing method and scanning electron microscope
- Patent number 8,309,923
- Issue date Nov 13, 2012
- Hitachi High-Technologies Corporation
- Seiko Omori
- G01 - MEASURING TESTING
Information Patent Grant
Localized static charge distribution precision measurement method a...
- Patent number 7,928,384
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE OBSERVING METHOD AND SCANNING ELECTRON MICROSCOPE
- Publication number 20110303843
- Publication date Dec 15, 2011
- Hitachi High-Technologies Corporation
- Seiko Omori
- G01 - MEASURING TESTING
Information Patent Application
Localized static charge distribution precision measurement method a...
- Publication number 20090057557
- Publication date Mar 5, 2009
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION AND MEASUREMENT APPARATUS
- Publication number 20080017797
- Publication date Jan 24, 2008
- Zhaohui CHENG
- H01 - BASIC ELECTRIC ELEMENTS