Membership
Tour
Register
Log in
Seima Kato
Follow
Person
Utsunomiya-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Wavefront aberration measuring method, wavefront aberration measuri...
Patent number
9,557,241
Issue date
Jan 31, 2017
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Transmitted wavefront measuring method, refractive-index distributi...
Patent number
8,786,863
Issue date
Jul 22, 2014
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Refractive index distribution measuring method and refractive index...
Patent number
8,525,982
Issue date
Sep 3, 2013
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Talbot interferometer, its adjustment method, and measurement method
Patent number
8,520,217
Issue date
Aug 27, 2013
Canon Kabushiki Kaisha
Toshiyuki Naoi
G01 - MEASURING TESTING
Information
Patent Grant
Refractive index distribution measuring method and apparatus using...
Patent number
8,508,725
Issue date
Aug 13, 2013
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Refractive index distribution measuring method and apparatus, and m...
Patent number
8,477,297
Issue date
Jul 2, 2013
Canon Kabushiki Kaisha
Seima Kato
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Refractive index distribution measurement method and apparatus that...
Patent number
8,472,013
Issue date
Jun 25, 2013
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront aberration measuring method, mask, wavefront aberration m...
Patent number
8,077,391
Issue date
Dec 13, 2011
Canon Kabushiki Kaisha
Chidane Ouchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measuring apparatus, exposure apparatus and method, and device manu...
Patent number
8,004,691
Issue date
Aug 23, 2011
Canon Kabushiki Kaisha
Chidane Ouchi
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus, exposure apparatus having the same, and devi...
Patent number
7,952,726
Issue date
May 31, 2011
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Measurement apparatus, exposure apparatus, and device fabrication m...
Patent number
7,692,799
Issue date
Apr 6, 2010
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing interference fringe
Patent number
7,474,413
Issue date
Jan 6, 2009
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus for measuring optical properties of tested optical system...
Patent number
7,443,515
Issue date
Oct 28, 2008
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method and apparatus using interference, exposure method...
Patent number
7,283,252
Issue date
Oct 16, 2007
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL APPARATUS, EVALUATION APPARATUS, EVALUATION METHOD, AND MAN...
Publication number
20230091165
Publication date
Mar 23, 2023
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE INDEX MEASURING METHOD, REFRACTIVE INDEX MEASURING APPAR...
Publication number
20160299066
Publication date
Oct 13, 2016
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE-INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE-INDEX DI...
Publication number
20150260605
Publication date
Sep 17, 2015
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT ABERRATION MEASURING METHOD, WAVEFRONT ABERRATION MEASURI...
Publication number
20140293275
Publication date
Oct 2, 2014
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD, REFRACTIVE INDEX DI...
Publication number
20120139136
Publication date
Jun 7, 2012
Canon Kabushiki Kaisha
Seima Kato
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD AND REFRACTIVE INDEX...
Publication number
20110292379
Publication date
Dec 1, 2011
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD AND REFRACTIVE INDEX...
Publication number
20110134438
Publication date
Jun 9, 2011
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
TALBOT INTERFEROMETER, ITS ADJUSTMENT METHOD, AND MEASUREMENT METHOD
Publication number
20100271636
Publication date
Oct 28, 2010
Canon Kabushiki Kaisha
Toshiyuki Naoi
G01 - MEASURING TESTING
Information
Patent Application
TRANSMITTED WAVEFRONT MEASURING METHOD, REFRACTIVE-INDEX DISTRIBUTI...
Publication number
20100245842
Publication date
Sep 30, 2010
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS HAVING THE SAME, AND DEVI...
Publication number
20100190115
Publication date
Jul 29, 2010
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD AND REFRACTIVE IND...
Publication number
20100165355
Publication date
Jul 1, 2010
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS, EXPOSURE APPARATUS AND METHOD, AND DEVICE MANU...
Publication number
20090290136
Publication date
Nov 26, 2009
Canon Kabushiki Kaisha
Chidane Ouchi
G01 - MEASURING TESTING
Information
Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
Publication number
20090268188
Publication date
Oct 29, 2009
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
WAVEFRONT ABERRATION MEASURING METHOD, MASK, WAVEFRONT ABERRATION M...
Publication number
20090213389
Publication date
Aug 27, 2009
Canon Kabushiki Kaisha
Chidane Ouchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION M...
Publication number
20080186509
Publication date
Aug 7, 2008
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for analyzing interference fringe
Publication number
20060203253
Publication date
Sep 14, 2006
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Exposure apparatus
Publication number
20060072091
Publication date
Apr 6, 2006
Seima Kato
G02 - OPTICS
Information
Patent Application
Apparatus for measuring optical properties of tested optical system...
Publication number
20060044569
Publication date
Mar 2, 2006
Canon Kabushiki Kaisha
Seima Kato
G01 - MEASURING TESTING
Information
Patent Application
Measuring method and apparatus using interference, exposure method...
Publication number
20050117171
Publication date
Jun 2, 2005
Canon Kabushiki Kaisha
Seima Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY