Seiya FUJITSU

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radar apparatus and signal processing method
- Patent number 11,294,046
- Issue date Apr 5, 2022
- DENSO TEN Limited
- Seiya Fujitsu
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus for estimating a movement direction of a target
- Patent number 11,237,260
- Issue date Feb 1, 2022
- DENSO TEN Limited
- Seiya Fujitsu
- G01 - MEASURING TESTING
Information Patent Grant
Radar apparatus
- Patent number 11,143,755
- Issue date Oct 12, 2021
- DENSO TEN Limited
- Shinya Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Radar apparatus and target detecting method
- Patent number 11,061,130
- Issue date Jul 13, 2021
- DENSO TEN Limited
- Seiya Fujitsu
- G01 - MEASURING TESTING
Information Patent Grant
Radar device and target detecting method
- Patent number 10,712,428
- Issue date Jul 14, 2020
- DENSO TEN Limited
- Seiya Fujitsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADAR APPARATUS
- Publication number 20200025908
- Publication date Jan 23, 2020
- DENSO TEN LIMITED
- Shinya AOKI
- G01 - MEASURING TESTING
Information Patent Application
RADAR APPARATUS AND SIGNAL PROCESSING METHOD
- Publication number 20200003888
- Publication date Jan 2, 2020
- DENSO TEN LIMITED
- Seiya FUJITSU
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS
- Publication number 20190383931
- Publication date Dec 19, 2019
- DENSO TEN LIMITED
- Seiya FUJITSU
- G01 - MEASURING TESTING
Information Patent Application
RADAR APPARATUS AND TARGET DETECTING METHOD
- Publication number 20190377081
- Publication date Dec 12, 2019
- DENSO TEN LIMITED
- Seiya FUJITSU
- G01 - MEASURING TESTING
Information Patent Application
RADAR DEVICE AND TARGET DETECTING METHOD
- Publication number 20180313935
- Publication date Nov 1, 2018
- DENSO TEN LIMITED
- Seiya FUJITSU
- G01 - MEASURING TESTING