Seiya Suzuki

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Patents Grantslast 30 patents

Information Patent Grant
Sampling circuit, sampling method, sampling oscilloscope, and wavef...
- Patent number 10,234,483
- Issue date Mar 19, 2019
- Anritsu Corporation
- Ken Mochizuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for measuring jitter transfer characteristic
- Patent number 8,432,958
- Issue date Apr 30, 2013
- Anritsu Corporation
- Seiya Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measuring apparatus
- Patent number 8,208,586
- Issue date Jun 26, 2012
- Anritsu Corporation
- Naosuke Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Instrument for measuring characteristic of data transmission system...
- Patent number 6,782,353
- Issue date Aug 24, 2004
- Anritsu Corporation
- Seiya Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLING CIRCUIT, SAMPLING METHOD, SAMPLING OSCILLOSCOPE, AND WAVEF...
- Publication number 20160363614
- Publication date Dec 15, 2016
- Anritsu Corporation
- Ken Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING JITTER TRANSFER CHARACTERISTIC
- Publication number 20100316105
- Publication date Dec 16, 2010
- Anritsu Corporation
- Seiya Suzuki
- G01 - MEASURING TESTING
Information Patent Application
JITTER MEASURING APPARATUS
- Publication number 20100246655
- Publication date Sep 30, 2010
- Naosuke Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
Instrument for measuring characteristic of data transmission system...
- Publication number 20030187622
- Publication date Oct 2, 2003
- Anritsu Corporation
- Seiya Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE