Sejin YOOK

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Fine dust measurement module and fine dust measurement device
- Patent number 12,105,000
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Ilhwan Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FINE DUST MEASUREMENT MODULE AND FINE DUST MEASUREMENT DEVICE INCLU...
- Publication number 20240118183
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Ilhwan KIM
- G01 - MEASURING TESTING
Information Patent Application
FINE DUST MEASUREMENT MODULE AND FINE DUST MEASUREMENT DEVICE
- Publication number 20230056602
- Publication date Feb 23, 2023
- Samsung Electronics Co., Ltd.
- Ilhwan KIM
- G01 - MEASURING TESTING