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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for analyzing electromagnetic wave, and comput...
Patent number
7,451,048
Issue date
Nov 11, 2008
Fujitsu Limited
Kenji Nagase
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for calculating immunity from radiated electromagnetic fi...
Patent number
6,879,942
Issue date
Apr 12, 2005
Fujitsu Limited
Kenji Nagase
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device generating data input to an electromagnetic field...
Patent number
6,766,261
Issue date
Jul 20, 2004
Fujitsu Limited
Sekiji Nishino
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for, and method of, calculating electromagnetic field str...
Patent number
6,285,973
Issue date
Sep 4, 2001
Fujitsu Limited
Sekiji Nishino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electromagnetic field strength calculator having function of displa...
Patent number
5,812,434
Issue date
Sep 22, 1998
Fujitsu Limited
Kenji Nagase
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electromagnetic field intensity calculating device
Patent number
5,745,370
Issue date
Apr 28, 1998
Fujitsu Limited
Shinichi Ohtsu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for calculating intensity of an electromagnetic field
Patent number
5,650,935
Issue date
Jul 22, 1997
Fujitsu Limited
Sekiji Nishino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Three-dimensional model cross-section instruction system
Patent number
5,623,583
Issue date
Apr 22, 1997
Fujitsu Limited
Sekiji Nishino
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for analyzing electromagnetic wave, and comput...
Publication number
20060095246
Publication date
May 4, 2006
FUJITSU LIMITED
Kenji Nagase
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and device generating data input to an electromagnetic field...
Publication number
20020140435
Publication date
Oct 3, 2002
FUJITSU LIMITED
Sekiji Nishino
G01 - MEASURING TESTING