Selim M. Unlu

Follow

Person

Jamaica Plain, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for enhanced single particle reflectance imaging
- Patent number 11,047,790
- Issue date Jun 29, 2021
- Trustees of Boston University
- Selim M. Unlu
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion microscopy system with deformable mirror for correc...
- Patent number 10,175,476
- Issue date Jan 8, 2019
- Trustees of Boston University
- Bennett B. Goldberg
- G02 - OPTICS
Information Patent Grant
Nanoparticles for self referencing calibration
- Patent number 10,151,680
- Issue date Dec 11, 2018
- Trustees of Boston University
- Selim M. Unlu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual-phase interferometry for charge modulation mapping in ICS
- Patent number 9,983,260
- Issue date May 29, 2018
- The United States of America as represented by the Secretary of the Air Force
- Abdulkadir Yurt
- G01 - MEASURING TESTING
Information Patent Grant
Spectral imaging for vertical sectioning
- Patent number 7,110,118
- Issue date Sep 19, 2006
- Trustees of Boston University
- Selim M. Ünlü
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR ENHANCED SINGLE PARTICLE REFLECTANCE IMAGING
- Publication number 20190162647
- Publication date May 30, 2019
- Trustees of Boston University
- Selim M. UNLU
- G02 - OPTICS
Information Patent Application
POLARIZATION ENHANCED INTERFEROMETRIC IMAGING
- Publication number 20170016821
- Publication date Jan 19, 2017
- Trustees of Boston University
- Selim UNLU
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICLES FOR SELF REFERENCING CALIBRATION
- Publication number 20160282253
- Publication date Sep 29, 2016
- Selim M. UNLU
- B82 - NANO-TECHNOLOGY
Information Patent Application
DUAL-PHASE INTERFEROMETRY FOR CHARGE MODULATION MAPPING IN ICS
- Publication number 20150276864
- Publication date Oct 1, 2015
- Trustees of Boston University
- Abdulkadir Yurt
- G01 - MEASURING TESTING
Information Patent Application
SOLID IMMERSION MICROSCOPY SYSTEM WITH DEFORMABLE MIRROR FOR CORREC...
- Publication number 20150185474
- Publication date Jul 2, 2015
- Bennett B. Goldberg
- G02 - OPTICS
Information Patent Application
Spectral imaging for vertical sectioning
- Publication number 20040036884
- Publication date Feb 26, 2004
- Selim M. Unlu
- G02 - OPTICS