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Sen-Wei Tsai
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Hsinchu, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
9,696,377
Issue date
Jul 4, 2017
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
7,721,173
Issue date
May 18, 2010
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
Patent number
7,552,373
Issue date
Jun 23, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for diagnosing failures in an integrated circu...
Patent number
7,191,373
Issue date
Mar 13, 2007
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
Publication number
20090235132
Publication date
Sep 17, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for broadcasting scan patterns in a scan-based...
Publication number
20030154433
Publication date
Aug 14, 2003
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for diagnosing failures in an integrated circu...
Publication number
20020138801
Publication date
Sep 26, 2002
Laung-Terng Wang
G01 - MEASURING TESTING