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Seock Woo JANG
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Suwon-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Particle measuring apparatus and measuring method using the same
Patent number
9,046,460
Issue date
Jun 2, 2015
Samsung Electronics Co., Ltd.
Yong Koo Lee
G01 - MEASURING TESTING
Information
Patent Grant
Sample analysis apparatus
Patent number
8,986,611
Issue date
Mar 24, 2015
Samsung Electronics Co., Ltd.
Yong Koo Lee
G01 - MEASURING TESTING
Information
Patent Grant
Management system of test device and management method thereof
Patent number
8,869,266
Issue date
Oct 21, 2014
Samsung Electronics Co., Ltd.
Jong Rip Lee
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
SAMPLE ANALYSIS APPARATUS
Publication number
20130033708
Publication date
Feb 7, 2013
Samsung Electronics Co., Ltd.
Yong Koo LEE
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING APPARATUS AND MEASURING METHOD USING THE SAME
Publication number
20120185211
Publication date
Jul 19, 2012
Samsung Electronics Co., Ltd.
Yong Koo LEE
G01 - MEASURING TESTING
Information
Patent Application
MANAGEMENT SYSTEM OF TEST DEVICE AND MANAGEMENT METHOD THEREOF
Publication number
20120167203
Publication date
Jun 28, 2012
Samsung Electronics Co., Ltd.
Jong Rip LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of displaying a color image and mobile terminal using the same
Publication number
20060109490
Publication date
May 25, 2006
SAMSUNG ELECTRONICS CO., LTD.
Jung-Hoon Park
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS