Seok Hiong Tan

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Test contact mechanism
- Patent number 6,703,853
- Issue date Mar 9, 2004
- Advanced Micro Devices, Inc.
- Boon Hee Wee
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for testing an integrated circuit package
- Patent number 6,531,865
- Issue date Mar 11, 2003
- Advanced Micro Devices, Inc.
- Zhihong Mai
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for loading a respective fuzz button into each of a high...
- Patent number 6,381,841
- Issue date May 7, 2002
- Advanced Micro Devices, Inc.
- Seok Hiong Tan
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for loading a respective fuzz button into each of a high...
- Patent number 6,192,576
- Issue date Feb 27, 2001
- Advanced Micro Devices, Inc.
- Seok Hiong Tan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit sorter that automatically prevents binning of in...
- Patent number 6,124,559
- Issue date Sep 26, 2000
- Advanced Micro Devices, Inc.
- Yiak Khian Heng
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING