Seokjung Yun

Person

Iksan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional semiconductor device
- Patent number 12,183,677
- Issue date Dec 31, 2024
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional semiconductor device
- Patent number 11,854,975
- Issue date Dec 26, 2023
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional semiconductor device
- Patent number 11,107,765
- Issue date Aug 31, 2021
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) semiconductor memory devices and methods of...
- Patent number 10,878,908
- Issue date Dec 29, 2020
- Samsung Electronics Co., Ltd.
- Da Woon Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) semiconductor memory devices and methods of...
- Patent number 10,482,964
- Issue date Nov 19, 2019
- Samsung Electronics Co., Ltd.
- Da Woon Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional semiconductor device
- Patent number 10,211,154
- Issue date Feb 19, 2019
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) semiconductor memory devices and methods of...
- Patent number 10,049,744
- Issue date Aug 14, 2018
- Samsung Electronics Co., Ltd.
- Da Woon Jeong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
- Publication number 20240105604
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
- Publication number 20210391260
- Publication date Dec 16, 2021
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
- Publication number 20200251417
- Publication date Aug 6, 2020
- Samsung Electronics Co., Ltd.
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...
- Publication number 20200075101
- Publication date Mar 5, 2020
- Samsung Electronics Co., Ltd.
- Da Woon JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
- Publication number 20190148295
- Publication date May 16, 2019
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...
- Publication number 20180336950
- Publication date Nov 22, 2018
- Da Woon JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...
- Publication number 20170200676
- Publication date Jul 13, 2017
- Da Woon JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
- Publication number 20170179028
- Publication date Jun 22, 2017
- Sung-Hun Lee
- H01 - BASIC ELECTRIC ELEMENTS

Seokjung Yun

Person

Patents Grantslast 30 patents

Three-dimensional semiconductor device

Test apparatus and test method thereof

Three-dimensional semiconductor device

Three-dimensional semiconductor device

Three-dimensional (3D) semiconductor memory devices and methods of...

Three-dimensional (3D) semiconductor memory devices and methods of...

Three-dimensional semiconductor device

Three-dimensional (3D) semiconductor memory devices and methods of...

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD THEREOF

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

TEST APPARATUS AND TEST METHOD THEREOF

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE

THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE

THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...

THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICES AND METHODS OF...

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE