Seonggwon JANG

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Asan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock conversion device, test system having the same, and method of...
- Patent number 12,032,019
- Issue date Jul 9, 2024
- Samsung Electronics Co., Ltd.
- Yongjeong Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM HAVING THE SAME, AND METHOD OF...
- Publication number 20220404417
- Publication date Dec 22, 2022
- Samsung Electronics Co., Ltd.
- Yongjeong KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS
- Publication number 20220178997
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Ungjin JANG
- G11 - INFORMATION STORAGE