Seongsil LEE

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
System and method of inspecting substrate and method of fabricating...
- Patent number 10,393,672
- Issue date Aug 27, 2019
- Samsung Electronics Co., Ltd.
- Jeongho Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus
- Patent number 10,067,067
- Issue date Sep 4, 2018
- Samsung Electronics Co., Ltd.
- Seongsil Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL IMAGING DEVICE
- Publication number 20250027875
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Jinwoo Lee
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF INSPECTING SUBSTRATE AND METHOD OF FABRICATING...
- Publication number 20190033232
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- JEONGHO AHN
- G02 - OPTICS
Information Patent Application
SUBSTRATE INSPECTION APPARATUS
- Publication number 20170067833
- Publication date Mar 9, 2017
- Samsung Electronics Co., Ltd.
- Seongsil LEE
- G01 - MEASURING TESTING