Seongwook LEE

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
DNN-based human face classification
- Patent number 12,153,123
- Issue date Nov 26, 2024
- BITSENSING INC.
- Jae-Eun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus with object velocity detection in radar system
- Patent number 11,867,792
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Woosuk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting object based on transforming vox...
- Patent number 11,828,873
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Woosuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial interpolation method and apparatus for linear phased array...
- Patent number 10,215,843
- Issue date Feb 26, 2019
- Mando Corporation
- Jaeeun Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Face identification using millimeter-wave radar sensor data
- Publication number 20220327863
- Publication date Oct 13, 2022
- Bitsensing Inc.
- Jae-eun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DNN-Based Human Face Classification
- Publication number 20210326581
- Publication date Oct 21, 2021
- Bitsensing Inc.
- Jae-Eun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING OBJECT BASED ON RADAR SIGNAL
- Publication number 20210302538
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- Woosuk KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH OBJECT VELOCITY DETECTION IN RADAR SYSTEM
- Publication number 20210247508
- Publication date Aug 12, 2021
- Samsung Electronics Co., Ltd.
- Woosuk KIM
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL INTERPOLATION METHOD AND APPARATUS FOR LINEAR PHASED ARRAY...
- Publication number 20170059694
- Publication date Mar 2, 2017
- Mando Corporation
- Jaeeun LEE
- G01 - MEASURING TESTING