Seonkyung Lee

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San Ramon, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining process rate
- Patent number 11,056,322
- Issue date Jul 6, 2021
- Lam Research Corporation
- Yassine Kabouzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and apparatus for using optical data to monitor RF g...
- Patent number 10,325,760
- Issue date Jun 18, 2019
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus with a spectral reflectometer for processing substrates
- Patent number 9,752,981
- Issue date Sep 5, 2017
- Lam Research Corporation
- Seonkyung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining process rate
- Patent number 9,735,069
- Issue date Aug 15, 2017
- Lam Research Corporation
- Yassine Kabouzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method and apparatus for using optical data to monitor RF g...
- Patent number 9,627,186
- Issue date Apr 18, 2017
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETERMINING PROCESS RATE
- Publication number 20170338160
- Publication date Nov 23, 2017
- LAM RESEARCH CORPORATION
- Yassine Kabouzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, METHOD AND APPARATUS FOR USING OPTICAL DATA TO MONITOR RF G...
- Publication number 20170200592
- Publication date Jul 13, 2017
- LAM RESEARCH CORPORATION
- John C. Valcore
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING PROCESS RATE
- Publication number 20170084503
- Publication date Mar 23, 2017
- LAM RESEARCH CORPORATION
- Yassine Kabouzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS WITH A SPECTRAL REFLECTOMETER FOR PROCESSING SUBSTRATES
- Publication number 20160320293
- Publication date Nov 3, 2016
- LAM RESEARCH CORPORATION
- Seonkyung LEE
- G01 - MEASURING TESTING
Information Patent Application
System, Method and Apparatus for Using Optical Data to Monitor RF G...
- Publication number 20160064199
- Publication date Mar 3, 2016
- LAM RESEARCH CORPORATION
- John C. Valcore
- G01 - MEASURING TESTING