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Tokyo, JP
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last 30 patents
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Patent Grant
Optical system for micro analyzing system
Patent number
7,259,849
Issue date
Aug 21, 2007
Enplas Corporation
Koichi Ono
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Optical system for micro analyzing system
Publication number
20040246597
Publication date
Dec 9, 2004
Koichi Ono
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL