Setanket, NY, US
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The Research Foundation for the State University of New York
Dmitri Gavrilov
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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The Research Foundation for the State University of New York
Mikhail Gouzman
G05 - CONTROLLING REGULATING
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The Research Foundation for the State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Maxion Technologies, Inc.
Gregory Belenky
B82 - NANO-TECHNOLOGY
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SRI International
Joseph H. Abeles
G01 - MEASURING TESTING
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Research Foundation of State University of New York
Michael A. Gurvitch
G01 - MEASURING TESTING
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Patent Grant
Research Foundation of State University of New York
Serge Luryi
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Maxion Technologies, Inc.
Gregory Belenky
B82 - NANO-TECHNOLOGY
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Patent Grant
Research Foundation of State University of New York
Serge Luryi
B82 - NANO-TECHNOLOGY
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Research Foundation of State University of New York
Sangmin Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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United States of America as represented by the Secretary of the Army
Gregory Belenky
H01 - BASIC ELECTRIC ELEMENTS
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Alexander Kastalsky
G01 - MEASURING TESTING
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Patent Grant
The Research Foundation of State University of New York
Sangmin Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Levon V. Asryan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Secretary of the Army
Gregory Belenky
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Grant
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Grant
Research Foundation of the State University of New York
Vera Gorfinkel
G01 - MEASURING TESTING
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Research Foundation of State University of New York
Vera Gorfinkel
G01 - MEASURING TESTING
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State University of New York at Stony Brook
Vera Gorfinkel
G01 - MEASURING TESTING
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Research Foundation of State of New York
Thomas G. Robertazzi
G06 - COMPUTING CALCULATING COUNTING
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The Research Foundation of State University of New York
Charles M. Fortmann
C30 - CRYSTAL GROWTH
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The Research Foundation of State University of New York
Bradley S. Carlson
G01 - MEASURING TESTING
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The Research Foundation of State University of New York
Thomas G. Robertazzi
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
The Research Foundation of State University of New York
Vera Gorfinkel
G01 - MEASURING TESTING
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Lucent Technologies Inc.
Nadia Lifshitz
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Research Foundation for the State University of New York
Dmitri Gavrilov
G01 - MEASURING TESTING
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Patent Application
The Research Foundation for the State University of New York
Mikhail Gouzman
G05 - CONTROLLING REGULATING
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Patent Application
Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Application
Gregory Belenky
B82 - NANO-TECHNOLOGY
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Patent Application
SRI International and Research Foundation of State University of New York
Joseph H. Abeles
G01 - MEASURING TESTING
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Patent Application
Michael A. Gurvitch
G01 - MEASURING TESTING
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Patent Application
Serge Luryi
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Alexander Kastalsky
G01 - MEASURING TESTING
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Patent Application
Serge Luryi
G02 - OPTICS
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Patent Application
Alexander Kastalsky
G01 - MEASURING TESTING
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Patent Application
Sangmin Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
Gregory Belenky
B82 - NANO-TECHNOLOGY
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Patent Application
Gregory Belenky
B82 - NANO-TECHNOLOGY
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Patent Application
Levon V. Asryan
B82 - NANO-TECHNOLOGY
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Patent Application
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Application
Sangmin Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
Mikhail Gouzman
G02 - OPTICS
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Patent Application
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Application
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Application
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
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Patent Application
The Research Foundation of State University of New York
Serge Luryi
G01 - MEASURING TESTING
