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Sergei V. Kalinin
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Oak Ridge, TN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Science-driven automated experiments
Patent number
11,982,684
Issue date
May 14, 2024
UT-Battelle, LLC
Maxim A. Ziatdinov
G01 - MEASURING TESTING
Information
Patent Grant
Atomic-scale e-beam sculptor
Patent number
11,518,674
Issue date
Dec 6, 2022
UT-Battelle, LLC
Sergei V. Kalinin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Pan-sharpening for microscopy
Patent number
11,313,878
Issue date
Apr 26, 2022
UT-Battelle, LLC
Olga S. Ovchinnikova
G01 - MEASURING TESTING
Information
Patent Grant
Beam controlled nano-robotic device
Patent number
10,777,381
Issue date
Sep 15, 2020
UT-Battelle, LLC
Sergei V. Kalinin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Bulk nanofabrication with single atomic plane precision via atomic-...
Patent number
10,400,351
Issue date
Sep 3, 2019
UT-Battelle, LLC
Albina Y. Borisevich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave AC conductivity of domain walls
Patent number
10,160,645
Issue date
Dec 25, 2018
UT-Battelle, LLC
Petro Maksymovych
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Full information acquisition in scanning probe microscopy and spect...
Patent number
9,612,257
Issue date
Apr 4, 2017
UT-Battelle, LLC
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Grant
Electrochemical force microscopy
Patent number
9,541,576
Issue date
Jan 10, 2017
UT-Battelle, LLC
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Grant
Band excitation method applicable to scanning probe microscopy
Patent number
9,535,087
Issue date
Jan 3, 2017
UT-Battelle, LLC
Stephen Jesse
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Band excitation method applicable to scanning probe microscopy
Patent number
9,097,738
Issue date
Aug 4, 2015
UT-Battelle, LLC
Stephen Jesse
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Real space mapping of oxygen vacancy diffusion and electrochemical...
Patent number
8,752,211
Issue date
Jun 10, 2014
UT-Battelle, LLC
Sergei V. Kalinin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Real space mapping of ionic diffusion and electrochemical activity...
Patent number
8,719,961
Issue date
May 6, 2014
UT-Battelle, LLC
Sergei V. Kalinin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Spatially resolved quantitative mapping of thermomechanical propert...
Patent number
8,484,759
Issue date
Jul 9, 2013
UT-Battelle, LLC
Stephen Jesse
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Band excitation method applicable to scanning probe microscopy
Patent number
8,448,502
Issue date
May 28, 2013
UT-Battelle, LLC
Stephen Jesse
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Band excitation method applicable to scanning probe microscopy
Patent number
7,775,086
Issue date
Aug 17, 2010
UT-Battelle, LLC
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Grant
Ferroelectric tunneling element and memory applications which utili...
Patent number
7,759,713
Issue date
Jul 20, 2010
UT-Battelle, LLC
Sergei V. Kalinin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultrahigh density ferroelectric storage and lithography by high ord...
Patent number
7,292,768
Issue date
Nov 6, 2007
UT-Battelle, LLC
Sergei V. Kalinin
G11 - INFORMATION STORAGE
Information
Patent Grant
Scanning probe microscopy apparatus and techniques
Patent number
7,093,509
Issue date
Aug 22, 2006
The Trustees of the University of Pennsylvania
Rui Shao
G01 - MEASURING TESTING
Information
Patent Grant
Spatially resolved electromagnetic property measurement
Patent number
7,078,896
Issue date
Jul 18, 2006
The Trustees of the University of Pennsylvania
Dawn A. Bonnell
G01 - MEASURING TESTING
Information
Patent Grant
Directed assembly of nanometer-scale molecular devices
Patent number
6,982,174
Issue date
Jan 3, 2006
The Trustees of the University of Pennsylvania
Dawn A. Bonnell
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Spatially resolved electromagnetic property measurement
Patent number
6,873,163
Issue date
Mar 29, 2005
The Trustees of the University of Pennsylvania
Dawn A. Bonnell
G01 - MEASURING TESTING
Information
Patent Grant
Tip calibration standard and method for tip calibration
Patent number
6,720,553
Issue date
Apr 13, 2004
Trustees of the University of Pennsylvania
Dawn Bonnell
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...
Publication number
20240288467
Publication date
Aug 29, 2024
UT-Battelle, LLC
Maxim A. Ziatdinov
G01 - MEASURING TESTING
Information
Patent Application
PAN-SHARPENING FOR MICROSCOPY
Publication number
20210325428
Publication date
Oct 21, 2021
UT-Battelle, LLC
Olga S. Ovchinnikova
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC-SCALE E-BEAM SCULPTOR
Publication number
20200247667
Publication date
Aug 6, 2020
UT-Battelle, LLC
Sergei V. Kalinin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
BULK NANOFABRICATION WITH SINGLE ATOMIC PLANE PRECISION VIA ATOMIC-...
Publication number
20180066376
Publication date
Mar 8, 2018
UT-Battelle, LLC
Albina Y. Borisevich
C30 - CRYSTAL GROWTH
Information
Patent Application
MICROWAVE AC CONDUCTIVITY OF DOMAIN WALLS
Publication number
20170099055
Publication date
Apr 6, 2017
UT-Battelle, LLC
Petro Maksymovych
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROCHEMICAL FORCE MICROSCOPY
Publication number
20160025773
Publication date
Jan 28, 2016
UT-Battelle, LLC
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Application
Band Excitation Method Applicable to Scanning Probe Microscopy
Publication number
20150293144
Publication date
Oct 15, 2015
UT-Battelle, LLC
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Application
REAL SPACE MAPPING OF OXYGEN VACANCY DIFFUSION AND ELECTROCHEMICAL...
Publication number
20140041085
Publication date
Feb 6, 2014
Sergei V. Kalinin
B82 - NANO-TECHNOLOGY
Information
Patent Application
BAND EXCITATION METHOD APPLICABLE TO SCANNING PROBE MICROSCOPY
Publication number
20130340125
Publication date
Dec 19, 2013
UT-Battelle, LLC
Stephen Jesse
B82 - NANO-TECHNOLOGY
Information
Patent Application
REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHEMICAL ACTIVITY...
Publication number
20120125783
Publication date
May 24, 2012
Sergei V. Kalinin
G01 - MEASURING TESTING
Information
Patent Application
SPATIALLY RESOLVED QUANTITATIVE MAPPING OF THERMOMECHANICAL PROPERT...
Publication number
20110041223
Publication date
Feb 17, 2011
UT-Battelle, LLC
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Application
BAND EXCITATION METHOD APPLICABLE TO SCANNING PROBE MICROSCOPY
Publication number
20110004967
Publication date
Jan 6, 2011
UT-Battelle, LLC
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Application
BAND EXCITATION METHOD APPLICABLE TO SCANNING PROBE MICROSCOPY
Publication number
20100011471
Publication date
Jan 14, 2010
Stephen Jesse
G01 - MEASURING TESTING
Information
Patent Application
ULTRAHIGH DENSITY FERROELECTRIC STORAGE AND LITHOGRAPHY BY HIGH ORD...
Publication number
20070274668
Publication date
Nov 29, 2007
UT-BATTELLE, LLC.
Sergei V. Kalinin
G11 - INFORMATION STORAGE
Information
Patent Application
Ferroelectric tunneling element and memory applications which utili...
Publication number
20070205448
Publication date
Sep 6, 2007
UT-BATTELLE, LLC.
Sergei V. Kalinin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning probe microscopy apparatus and techniques
Publication number
20050262930
Publication date
Dec 1, 2005
Rui Shao
G01 - MEASURING TESTING
Information
Patent Application
Spatially resolved electromagnetic property measurement
Publication number
20050174130
Publication date
Aug 11, 2005
Trustees of the University of Pennsylvania
Dawn A. Bonnell
G01 - MEASURING TESTING
Information
Patent Application
Directed assembly of nanometer-scale molecular devices
Publication number
20040029297
Publication date
Feb 12, 2004
Dawn A. Bonnell
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Tip calibration standard and method for tip calibration
Publication number
20030132376
Publication date
Jul 17, 2003
The Trustees of the University of Pennsylvania
Dawn Bonnell
G01 - MEASURING TESTING
Information
Patent Application
Spatially resolved electromagnetic property measurement
Publication number
20030067308
Publication date
Apr 10, 2003
Dawn A. Bonnell
B82 - NANO-TECHNOLOGY