SERGEJ DEUTSCH

Person

Durham, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Software-based self-test and diagnosis using on-chip memory
- Patent number 10,845,416
- Issue date Nov 24, 2020
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software-based self-test and diagnosis using on-chip memory
- Patent number 10,788,532
- Issue date Sep 29, 2020
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal tracing using on-chip memory for in-system post-fabrication...
- Patent number 10,732,221
- Issue date Aug 4, 2020
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-invasive pre-bond TSV test using ring oscillators and multiple...
- Patent number 10,444,279
- Issue date Oct 15, 2019
- Duke University
- Krishnendu Chakrabarty
- G01 - MEASURING TESTING
Information Patent Grant
Software-based self-test and diagnosis using on-chip memory
- Patent number 9,864,007
- Issue date Jan 9, 2018
- Duke University
- Sergej Deutsch
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal tracing using on-chip memory for in-system post-fabrication...
- Patent number 9,720,036
- Issue date Aug 1, 2017
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-invasive pre-bond TSV test using ring oscillators and multiple...
- Patent number 9,482,720
- Issue date Nov 1, 2016
- Duke University
- Krishnendu Chakrabarty
- G01 - MEASURING TESTING
Information Patent Grant
Controlled toggle rate of non-test signals during modular scan test...
- Patent number 8,914,689
- Issue date Dec 16, 2014
- Cadence Design Systems, Inc.
- Erik Jan Marinissen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY
- Publication number 20180095128
- Publication date Apr 5, 2018
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY
- Publication number 20180095129
- Publication date Apr 5, 2018
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TRACING USING ON-CHIP MEMORY FOR IN-SYSTEM POST-FABRICATION...
- Publication number 20170299655
- Publication date Oct 19, 2017
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE PRE-BOND TSV USING RING OSCILLATORS AND MULTIPLE VOLTA...
- Publication number 20170003340
- Publication date Jan 5, 2017
- DUKE UNIVERSITY
- KRISHNENDU CHAKRABARTY
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TRACING USING ON-CHIP MEMORY FOR IN-SYSTEM POST-FABRICATION...
- Publication number 20160047859
- Publication date Feb 18, 2016
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY
- Publication number 20150316605
- Publication date Nov 5, 2015
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE PRE-BOND TSV TEST USING RING OSCILLATORS AND MULTIPLE...
- Publication number 20140225624
- Publication date Aug 14, 2014
- DUKE UNIVERSITY
- KRISHNENDU CHAKRABARTY
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED TOGGLE RATE OF NON-TEST SIGNALS DURING MODULAR SCAN TEST...
- Publication number 20140082421
- Publication date Mar 20, 2014
- Cadence Design Systems, Inc.
- Erik Jan Marinissen
- G01 - MEASURING TESTING

SERGEJ DEUTSCH

Person

Patents Grantslast 30 patents

Software-based self-test and diagnosis using on-chip memory

Software-based self-test and diagnosis using on-chip memory

Signal tracing using on-chip memory for in-system post-fabrication...

Non-invasive pre-bond TSV test using ring oscillators and multiple...

Software-based self-test and diagnosis using on-chip memory

Signal tracing using on-chip memory for in-system post-fabrication...

Non-invasive pre-bond TSV test using ring oscillators and multiple...

Controlled toggle rate of non-test signals during modular scan test...

Patents Applicationslast 30 patents

SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

SIGNAL TRACING USING ON-CHIP MEMORY FOR IN-SYSTEM POST-FABRICATION...

NON-INVASIVE PRE-BOND TSV USING RING OSCILLATORS AND MULTIPLE VOLTA...

SIGNAL TRACING USING ON-CHIP MEMORY FOR IN-SYSTEM POST-FABRICATION...

SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

NON-INVASIVE PRE-BOND TSV TEST USING RING OSCILLATORS AND MULTIPLE...

CONTROLLED TOGGLE RATE OF NON-TEST SIGNALS DURING MODULAR SCAN TEST...